Special issue: 26th international symposium on VLSI design and test 2022

被引：0
|
作者：
Shah, Ambika Prasad [1 ]
Dasgupta, Sudeb [2 ]
机构：
[1] Indian Inst Technol Jammu, Dept Elect Engn, IC ResQ Lab, Jammu 181221, Jammu & Kashmir, India
[2] Indian Inst Technol Roorkee, Elect & Commun Engn Dept, Roorkee 247667, Uttaranchal, India
来源：
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING | 2023年 / 116卷 / 1-2期
关键词：
Compendex;
D O I：
10.1007/s10470-023-02184-6
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1 / 3
页数：3
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