Charged Hybrid Microstructures in Transparent Thin-Film ITO Traps: Localization and Optical Control

被引:5
作者
Shcherbinin, Dmitrii [1 ]
Rybin, Vadim [1 ]
Rudyi, Semyon [1 ]
Dubavik, Aliaksei [1 ]
Cherevkov, Sergei [1 ]
Rozhdestvensky, Yuri [1 ]
Ivanov, Andrei [1 ]
机构
[1] ITMO Univ, Int Res & Educ Ctr Phys Nanostruct, Kronverksky Prospekt 49, Bldg A, St Petersburg 197101, Russia
来源
SURFACES | 2023年 / 6卷 / 02期
基金
俄罗斯科学基金会;
关键词
thin films; indium tin oxide; surface ion trap; optomechanics; double-well trap; microstructures; ELECTROOPTICAL PROPERTIES; SPUTTERING POWER; ION-TRAP; PRESSURE; DC;
D O I
10.3390/surfaces6020010
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In the present study, we propose a new transparent thin-film ITO surface radio-frequency (RF) trap. Charged hybrid microstructures were localized in the developed ITO trap. We show, analytically and experimentally, that the position of the localization zones in the trapped hybrid structure are stable. The transfer of charged particles between localization zones was studied under the action of gravity-compensating laser radiation. We highlight the advantages of transparent thin-film ITO traps to investigate and manipulate charged particles.
引用
收藏
页码:133 / 144
页数:12
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