Data-Driven Test Generation for Black-Box Systems From Learned Decision Tree Models

被引:0
作者
Plambeck, Swantje [1 ]
Fey, Goerschwin [1 ]
机构
[1] Hamburg Univ Technol, Hamburg, Germany
来源
2023 26TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, DDECS | 2023年
关键词
Automatic Test Generation; Decision Trees; Test Coverage; Model Learning;
D O I
10.1109/DDECS57882.2023.10139633
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Testing of black-box systems is a difficult task, because no prior knowledge on the system is given that can be used for design and evaluation of tests. Learning a model of a black-box system from observations enables model-based testing (MBT). We take a recent approach using decision tree learning to create a model of a black-box system and discuss the usage of such a decision tree model for test generation. In this scope, we define a test coverage metric for decision tree models. Furthermore, we identify different modes of testing and explain that a decision tree model especially facilitates model-based testing for black-box systems with limited controllability of inputs and the inability to reset the system to a specific state. A case study on a discrete system illustrates our MBT approach.
引用
收藏
页码:27 / 32
页数:6
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