共 50 条
- [42] Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2013, 210 (11): : 2416 - 2422
- [45] Characterization of multilayers of thin films by measurement of X-ray specular reflectivity VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 2002, 57 (304): : 387 - 429
- [46] Interface investigations by infrared spectroscopy and X-ray reflectivity measurements of cubic boron nitride thin films SURFACE & COATINGS TECHNOLOGY, 1999, 116 : 274 - 277
- [50] X-RAY AND NEUTRON REFLECTIVITY ANALYSIS OF THIN-FILMS AND SUPERLATTICES APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 58 (03): : 159 - 168