Quantitative X-ray scattering and reflectivity measurements of polymer thin films with 2D detectors

被引:4
|
作者
Hu, Mingqiu [1 ,2 ]
Gan, Xuchen [1 ]
Chen, Zhan [1 ]
Seong, Hong-Gyu [1 ]
Emrick, Todd [1 ]
Russell, Thomas P. [1 ,2 ]
机构
[1] Univ Massachusetts, Polymer Sci & Engn Dept, Amherst, MA USA
[2] Univ Massachusetts, Polymer Sci & Engn Dept, Amherst, MA 01003 USA
关键词
area detector; data visualization and analysis; X-ray scattering; SMALL-ANGLE SCATTERING; NEUTRON-SCATTERING; SAXS; COPOLYMERS; PROTEINS; SYSTEMS;
D O I
10.1002/pol.20230530
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
We describe a fully open-sourced Python package to process raw X-ray scattering data using a GANESHA SAXSLAB facility, and review in this manuscript the connection of X-ray scattering theories with the open-sourced package. This package affords researchers more flexibility in analyzing and visualizing X-ray scattering and reflectivity data from what is now a commonplace facility at many universities and research laboratories engaged in polymer research. We briefly review the applications of X-ray scattering and diffraction, followed by the scattering theories. A pedagogical introduction to processing X-ray scattering data is provided using the modules in the Python package. We compare conventions to visualize and interpret transmission and grazing-incidence scattering data using self-assembled lamellar morphology of bottlebrush copolymers as an example, then describe how area detectors measure specular and off-specular reflectivity. Examples of in-house reflectivity and grazing incidence scattering for the metrological examination of a grating are provided, where the full pitch and pitch height of a line pattern is measured easily without needing to simulate the full scattering intensity profile.
引用
收藏
页码:3642 / 3662
页数:21
相关论文
共 50 条
  • [1] X-ray and neutron reflectivity measurements of polymer thin films and interfaces.
    Lin, EK
    Soles, C
    Wu, WL
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2005, 229 : U928 - U928
  • [2] MEASUREMENTS OF CARBON THIN-FILMS USING X-RAY REFLECTIVITY
    TONEY, MF
    BRENNAN, S
    JOURNAL OF APPLIED PHYSICS, 1989, 66 (04) : 1861 - 1863
  • [3] Characterization of thin films by means of soft X-ray reflectivity measurements
    Friedrich, J
    APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, 1999, 475 : 492 - 495
  • [4] Analysis of mesoporous thin films by X-ray reflectivity, optical reflectivity and grazing incidence small angle X-ray scattering
    Gibaud, A.
    Dourdain, S.
    Vignaud, G.
    APPLIED SURFACE SCIENCE, 2006, 253 (01) : 3 - 11
  • [5] Dewetting of thin polymer films: an X-ray scattering study
    Muller-Buschbaum, P
    Stamm, M
    PHYSICA B, 1998, 248 : 229 - 237
  • [6] INTERFACES AND THIN POLYMER FILMS AS SEEN BY X-RAY AND NEUTRON REFLECTIVITY TECHNIQUE
    Stamm, Manfred
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C34 - C34
  • [7] Adsorption of thin isobutane films on silicon investigated by X-ray reflectivity measurements
    Shokuie, Kaveh
    Paulus, Michael
    Sternemann, Christian
    Fendt, Robert
    Tolan, Metin
    THIN SOLID FILMS, 2007, 515 (14) : 5660 - 5663
  • [8] Using 2D detectors for x-ray imaging
    Prugovecki, Stjepan
    Beckers, Detlef
    Seo, Koichi
    Gateshki, Milen
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2011, 67 : C765 - C765
  • [9] Semiconductor detectors for 2D X-ray imaging
    Ponpon, JP
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 551 (01): : 15 - 26
  • [10] X-ray reflectivity study of fine structure of thin polymer films and polymer assembly at interface
    Yamaoka, H
    Matsuoka, H
    Kago, K
    Endo, H
    Eckelt, J
    PHYSICA B, 1998, 248 : 280 - 283