Triangular Pulse-Based IC Switching Current Model Using Multiple Regression Analysis for Fast Side-Channel Attack Prediction

被引:5
作者
Himuro, Masaki [1 ]
Iokibe, Kengo [2 ]
Toyota, Yoshitaka [2 ]
机构
[1] Okayama Univ, Grad Sch Environm Life Nat Sci & Technol, Okayama 7008530, Japan
[2] Okayama Univ, Fac Environm Life Nat Sci & Technol, Okayama 7008530, Japan
关键词
Advanced encryption standard (AES); correlation power analysis; field programmable gate array (FPGA); multiple regression analysis; prediction of electromagnetic information leakage; register transfer level; side-channel attack; LEAKAGE SIMULATION; POWER; NOISE;
D O I
10.1109/TEMC.2023.3345883
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Side-channel attacks (SCAs) pose a threat to cryptographic security by potentially recovering secret keys through the analysis of radio-frequency switching noise emitted from cryptographic integrated circuits (ICs). Predicting tolerance for SCAs enables the implementation of countermeasures in the short term. To enable fast prediction, we model the switching current transferred from the IC to the power distribution network (PDN) as a triangular pulse, subsequently applying multiple regression analysis to this pulse. As in our previous paper, we approximate the triangular pulse using register transfer level (RTL) logic simulations, which facilitate a faster prediction of the current. By applying multiple regression analysis, we can predict the SCA tolerance using a few current waveforms. To validate our model, we predicted the switching current for a field programmable gate array (FPGA) implementing the advanced encryption standard (AES) circuit, converted this into PDN noise, and then performed a primary SCA method called correlation power analysis (CPA). The results show that our method can predict PDN noise and SCA tolerance with more than a 90% reduction in analysis time compared to the previous method.
引用
收藏
页码:49 / 60
页数:12
相关论文
共 34 条
[11]   A Study for Improving Signal-to-Noise Ratio Measurement Method in Side-Channel Information Leakage of Cryptographic Hardware [J].
Iokibe, Kengo ;
Himuro, Masaki ;
Toyota, Yoshitaka .
2022 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & SIGNAL/POWER INTEGRITY, EMCSI, 2022, :294-298
[12]  
Iokibe K, 2015, IEEE INT SYMP ELEC, P224, DOI 10.1109/ISEMC.2015.7256163
[13]   Equivalent Circuit Modeling of Cryptographic Integrated Circuit for Information Security Design [J].
Iokibe, Kengo ;
Amano, Tetsuo ;
Okamoto, Kaoru ;
Toyota, Yoshitaka .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2013, 55 (03) :581-588
[14]  
Kocher P., 1999, Proceedings of the 19th Annual International Cryptology Conference on Advances in Cryptology, CRYPTO '99, P388, DOI 10.1007/3-540-48405-1_25
[15]  
Kulali E, 2007, ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING, P259
[16]  
Kumar A, 2017, ICCAD-IEEE ACM INT, P123, DOI 10.1109/ICCAD.2017.8203769
[17]   PoweRock: Power Modeling and Flexible Dynamic Power Management for Many-Core Architectures [J].
Lai, Zhiquan ;
Lam, King Tin ;
Wang, Cho-Li ;
Su, Jinshu .
IEEE SYSTEMS JOURNAL, 2017, 11 (02) :600-612
[18]   Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis [J].
Lin, Lang ;
Selvakumaran, Dinesh ;
Zhu, Deqi ;
Chang, Norman ;
Chow, Calvin ;
Nagata, Makoto ;
Monta, Kazuki .
2020 6TH IEEE INTERNATIONAL SYMPOSIUM ON SMART ELECTRONIC SYSTEMS (ISES 2020) (FORMERLY INIS), 2020, :133-138
[19]  
Mangard S., 2007, Power analysis attacks-revealing the secrets of smart cards, DOI 10.1007/978-0-387-38162-6
[20]  
National Institute of Standards and Technology (NIST), 2001, NIST FIPS PUBL