Development and characterization of ultra-high translucent zirconia using new manufacturing technology

被引:15
作者
Ban, Seiji [1 ]
机构
[1] Aichi Gakuin Univ, Sch Dent, Dept Dent Mat Sci, Nagoya, Aichi, Japan
关键词
Development; Characterization; Ultra-high translucent zirconia; Cyclic CIP; Plus Y technology; SINTERING KINETICS; ACTIVATION-ENERGY; GRAIN-GROWTH; CYCLIC-CIP;
D O I
10.4012/dmj.2022-243
中图分类号
R78 [口腔科学];
学科分类号
1003 ;
摘要
This review describes the development of ultra-high translucent zirconia (referred to as UHTZ) using new manufacturing technology and its characterization results. The development of UHTZ was primarily due to the adoption of two basic manufacturing technologies, "Cyclic CIP" and "Plus Y Technology". This manufacturing technology could provide stable processing characteristics, which improves chipping resistance during milling. Furthermore, the enlargement factor (processing coefficient) for UHTZ is smaller than those for conventional products. In general, the higher the light transmittance, the lower the flexural strength. Despite its extremely high translucency, the most significant feature of UTHZ is that its flexural strength is comparable to that of 5Y. Furthermore, UHTZ has higher chemical durability and uniform microstructure, which results in less wear on the opposing teeth and superior discoloration resistance. Therefore, UHTZ is a new option for inlay, onlay, and laminate veneer applications, where lithium disilicate glass ceramics has been widely used.
引用
收藏
页码:1 / 10
页数:10
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