X-ray diffractometric study of HDPE/GaAs and HDPE/GaAs<Te> composites

被引：1
|
作者：
Gadzhieva, N. N. [1 ]
Ahmadova, G. B. [2 ]
Melikova, S. Z. [1 ]
Asadov, F. G. [1 ]
机构：
[1] Minist Sci & Educ Republ Aze, Inst Radiat Problems, Baku, Azerbaijan
[2] Minist Sci & Educ Republ Azerbaijan, Inst Phys, Baku, Azerbaijan
来源：
PHYSICS AND CHEMISTRY OF SOLID STATE | 2023年 / 24卷 / 01期
关键词：
high density polyethylene; GaAs; GaAs < Te >; composites; X-ray diffractometry method;
D O I：
10.15330/pcss.24.1.23-25
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
High-density polyethylene sheets (HDPE), HDPE/GaAs and HDPE/ GaAs<Te> composites with GaAs and GaAs<Te> semiconductor fillers were studied by X-ray diffractometry at room temperature. The degree of crystallization of these samples was calculated and it was determined that the inclusion of fillers in the polymer matrix (x=1-10% composite) leads to an increase in the degree of crystallization by 1.3-1.4 times. The obtained results are explained by the change of the upper molecular structure of the polymer.
引用
收藏
页码：23 / 25
页数：3
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