Grain size effect on the temperature-dependence of elastic modulus of nanocrystalline NiTi

被引:21
作者
Chu, Kangjie [1 ]
Wang, Bing [2 ]
Li, Qiao [3 ]
Onuki, Yusuke [4 ]
Ren, Fuzeng [1 ]
机构
[1] Southern Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Guangdong, Peoples R China
[2] Southwest Univ Sci & Technol, Sch Mfg Sci & Engn, Key Lab Testing Mfg Proc, Minist Educ, Mianyang 621010, Sichuan, Peoples R China
[3] Wuhan Univ, Dept Engn Mech, Wuhan 430000, Hubei, Peoples R China
[4] Ibaraki Univ, Frontier Res Ctr Appl Atom Sci, Ibaraki, Japan
基金
中国国家自然科学基金;
关键词
Shape memory alloys; Elastic modulus; Neutron diffraction; Grain size effect; Molecular dynamics simulation; SHAPE-MEMORY ALLOYS; MARTENSITIC PHASE-TRANSFORMATIONS; POLYCRYSTALLINE NITI; DEFORMATION; BEHAVIOR; STRESS; MODEL;
D O I
10.1016/j.jallcom.2022.167907
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The effect of grain size on temperature-dependent elastic modulus (TDEM) of polycrystalline NiTi over a temperature span of 200 degrees C was investigated by dynamic thermomechanical analysis (DMA). It is found that the TDEM rapidly reduced with grain size down to nanoscale. In -situ neutron diffraction and molecular dynamics (MD) simulation reveal that the volume fraction and thermal stability of austenite phase at low temperature gradually increased with the reduction of grain size due to the mechanical constraint of grain boundary, which results in the two-phase coexistence during cooling. The compensation of the intrinsic opposite TDEM of austenite and martensite leads to the overall reduced TDEM in nanocrystalline NiTi. This study strongly implies that the TDEM of shape memory alloy can be tailored by grain size.(c) 2022 Elsevier B.V. All rights reserved.
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页数:6
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共 34 条
[1]   Origin of zero and negative thermal expansion in severely-deformed superelastic NiTi alloy [J].
Ahadi, A. ;
Matsushita, Y. ;
Sawaguchi, T. ;
Sun, Q. P. ;
Tsuchiya, K. .
ACTA MATERIALIA, 2017, 124 :79-92
[2]   Effects of grain size on the rate-dependent thermomechanical responses of nanostructured superelastic NiTi [J].
Ahadi, Aslan ;
Sun, Qingping .
ACTA MATERIALIA, 2014, 76 :186-197
[3]   Stress hysteresis and temperature dependence of phase transition stress in nanostructured NiTi-Effects of grain size [J].
Ahadi, Aslan ;
Sun, Qingping .
APPLIED PHYSICS LETTERS, 2013, 103 (02)
[4]   Temperature-dependent behavior of a polycrystalline NiTi shape memory alloy around the transformation regime [J].
Benafan, O. ;
Noebe, R. D. ;
Padula, S. A., II ;
Gaydosh, D. J. ;
Lerch, B. A. ;
Garg, A. ;
Bigelow, G. S. ;
An, K. ;
Vaidyanathan, R. .
SCRIPTA MATERIALIA, 2013, 68 (08) :571-574
[5]   Recoverability of large strains and deformation twinning in martensite during tensile deformation of NiTi shape memory alloy polycrystals [J].
Chen, Yuchen ;
Molnarova, Orsolya ;
Tyc, Ondrej ;
Kaderavek, Lukas ;
Heller, Ludek ;
Sittner, Petr .
ACTA MATERIALIA, 2019, 180 :243-259
[6]   Elinvar effect in Co-doped TiNi strain glass alloys [J].
Cui, Jian ;
Ren, Xiaobing .
APPLIED PHYSICS LETTERS, 2014, 105 (06)
[7]   Microstructure changes during non-conventional heat treatment of thin Ni-Ti wires by pulsed electric current studied by transmission electron microscopy [J].
Delville, R. ;
Malard, B. ;
Pilch, J. ;
Sittner, P. ;
Schryvers, D. .
ACTA MATERIALIA, 2010, 58 (13) :4503-4515
[8]   Elinvar property of cold-rolled NiTi alloy [J].
Deng, Zhongzheng ;
Chu, Kangjie ;
Li, Qiao ;
Onuki, Yusuke ;
Sun, Qingping .
SCRIPTA MATERIALIA, 2020, 187 (187) :197-201
[9]   MODEL FREE-ENERGY, MECHANICS, AND THERMODYNAMICS OF SHAPE MEMORY ALLOYS [J].
FALK, F .
ACTA METALLURGICA, 1980, 28 (12) :1773-1780
[10]   IBARAKI materials design diffractometer (iMATERIA)-Versatile neutron diffractometer at J-PARC [J].
Ishigaki, T. ;
Hoshikawa, A. ;
Yonemura, M. ;
Morishima, T. ;
Kamiyama, T. ;
Oishi, R. ;
Aizawa, K. ;
Sakuma, T. ;
Tomota, Y. ;
Arai, M. ;
Hayashi, M. ;
Ebata, K. ;
Takano, Y. ;
Komatsuzaki, K. ;
Asano, H. ;
Takano, Y. ;
Kasao, T. .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2009, 600 (01) :189-191