In Situ TEM/STEM Investigation of Crystallization in Y3Al5O12:Ce at High Temperatures Inside a Transmission Electron Microscope

被引:1
作者
Liu, Zheng [1 ]
Nakamura, Hitomi [2 ]
Akai, Tomoko [2 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Innovat Funct Mat Res Inst, 4-205 Sakurazaka, Nagoya, Aichi 4638560, Japan
[2] Natl Inst Adv Ind Sci & Technol, Nanomat Res Inst, 1-8-31 Midorigaoka, Ikeda, Osaka 5638577, Japan
关键词
crystallization; energy-dispersive X-ray spectroscopy; in situ observation; scanning transmission electron microscopy; transmission electron microscopy; YAG:Ce; SINGLE ATOMS; Z-CONTRAST; PHOSPHORS; PARTICLES; DEPENDENCE; RESOLUTION; COLUMNS; CRYSTAL; POWDER; YAGCE;
D O I
10.1002/smll.202308001
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Y3Al5O12:Ce (YAG:Ce) phosphors are extensively used in the field of white light-emitting diodes (LEDs) due to their efficient luminescent properties. To optimize the performance of YAG:Ce phosphors, a comprehensive understanding of their synthesis and structural evolution is essential. This paper presents a direct in situ transmission electron microscopy (TEM) /scanning TEM (STEM) investigation on the transformation process of a precursor comprising nanocrystalline CeO2 dispersed in an amorphous Y-Al oxide matrix into crystalline YAG:Ce particles. The study reveals that nanocrystalline CeO2 particles dissolve completely in the Y-Al oxide matrix at a temperature above 900 degrees C, while YAlO3 (YAP)-type crystalline particles with Al2O3 phase in grain boundaries are observed above 1000 degrees C. Finally, YAG:Ce-type crystalline particles are formed above 1180 degrees C. Atomic-resolution energy-dispersive X-ray spectroscopy (EDS) elemental mapping demonstrates that the doped cerium (Ce) atoms occupy the same atomic sites as yttrium (Y). Photoluminescence measurements validate the efficient luminescent properties of the obtained YAG:Ce phosphor.
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页数:6
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