Common mode far field radiation mechanisms and prediction of a buck converter with cables based on common mode voltage mutation method

被引:0
作者
He, Junping [1 ]
Wang, Han [1 ]
Zhao, Pengyang [1 ]
Wang, Weixin [1 ]
Cao, Lingling [1 ]
机构
[1] Harbin Inst Technol Shenzhen, Power Elect & Elect Drives Ctr, Shenzhen, Peoples R China
关键词
DC-DC power convertors; electromagnetic compatibility; electromagnetic fields; electromagnetic interference; PRINTED-CIRCUIT BOARD; EMISSIONS; DIFFERENCE; EMI;
D O I
10.1049/pel2.12652
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the field of electromagnetic compatibility (EMC) research, the knowledge of the formation mechanism of the far field electromagnetic radiation and its prediction is essential for the electromagnetic noise suppression design of a switched mode power supply. This paper investigates the equivalent driving sources of the common mode (CM) current of a Buck converter with cables. Based on the concept of CM voltage mutation, this paper proposes two mechanism models of the same-direction CM voltage driving mode and the opposite-direction CM voltage driving mode and derives the approximate analytical formulas for the far field intensity estimation of the horizontal cables. To evaluate the predictive effectiveness of the CM far field radiation model, a 30 MHz very high frequency (VHF) Buck prototype with shielded cables is built and tested, and a shielding shell and low impedance ground conductor suppression designs are then verified. The CM electromagnetic radiation mechanisms of a non-isolated power converter are demonstrated here. The proposed electromagnetic radiation models, approximate analytical formulas, and improvement design can help to advance the CM radiation analysis and optimization design. This study investigates the common mode (CM) driving sources of a regular Buck converter in depth, derives the approximate analytical formulas for far field radiation of horizontal power cables, and realizes the accurate prediction of far field CM radiation based on the CM voltage mutation method.image
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页码:1567 / 1582
页数:16
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