Novel Reconfigurable Field-Effect Transistor With Arch-Shaped Gate to Improve On-State Current
被引:2
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作者:
Hu, Junfeng
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East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China
Hu, Junfeng
[1
]
Sun, Yabin
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机构:
East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China
East China Normal Univ, Chongqing Key Lab Precis Opt, Chongqing Inst, Chongqing 401120, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China
Sun, Yabin
[1
,2
]
Liu, Ziyu
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机构:
Fudan Univ, Sch Microelect, Shanghai 200433, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China
Liu, Ziyu
[3
]
Li, Xiaojin
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机构:
East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China
Li, Xiaojin
[1
]
Shi, Yanling
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机构:
East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China
Shi, Yanling
[1
]
机构:
[1] East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China
[2] East China Normal Univ, Chongqing Key Lab Precis Opt, Chongqing Inst, Chongqing 401120, Peoples R China
[3] Fudan Univ, Sch Microelect, Shanghai 200433, Peoples R China
In this article, we report a novel structure of reconfigurable field-effect transistor (RFET) with arch-shaped control gate (ASG)-RFET. Compared with the conventional RFET, the ON-state current I-ON of the proposed ASG-RFET is found to improve about 5.87 times for the n-type program and 4.32 times for the p-type program. The current enhancement mechanism and the impact of geometry parameters are investigated, in the point of threshold voltage (V-TH), ON-state current (I-ON), off-state current (I-OFF), subthreshold swing (SS), gate capacitance (C-gg), and prop-agation delay tau by 3-D technology computer-aided design (TCAD) simulations. It is demonstrated that the tunneling rate and tunneling area are increased significantly in novel RFET. Moreover, the propagation delay is declined six times under the combined action of ON-state current and gate capacitance. The underlying physical mechanism is also discussed.
机构:
East China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R China
Li, Xianglong
Sun, Yabin
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机构:
East China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R China
Sun, Yabin
Li, Xiaojin
论文数: 0引用数: 0
h-index: 0
机构:
East China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R China
Li, Xiaojin
Shi, Yanling
论文数: 0引用数: 0
h-index: 0
机构:
East China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R China
Shi, Yanling
Liu, Ziyu
论文数: 0引用数: 0
h-index: 0
机构:
Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaEast China Normal Univ, Dept Elect Engn, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R China
机构:
Fudan Univ, Sch Microelect, Shanghai 200433, Peoples R ChinaFudan Univ, Sch Microelect, Shanghai 200433, Peoples R China
Hu, Junfeng
Wang, Chao
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机构:
East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R ChinaFudan Univ, Sch Microelect, Shanghai 200433, Peoples R China
Wang, Chao
Sun, Yabin
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h-index: 0
机构:
East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R China
East China Normal Univ, Chongqing Key Lab Precis Opt, Chongqing Inst, Chongqing 401120, Peoples R ChinaFudan Univ, Sch Microelect, Shanghai 200433, Peoples R China
Sun, Yabin
Liu, Ziyu
论文数: 0引用数: 0
h-index: 0
机构:
Fudan Univ, Sch Microelect, Shanghai 200433, Peoples R ChinaFudan Univ, Sch Microelect, Shanghai 200433, Peoples R China
Liu, Ziyu
Li, Xiaojin
论文数: 0引用数: 0
h-index: 0
机构:
East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R ChinaFudan Univ, Sch Microelect, Shanghai 200433, Peoples R China
Li, Xiaojin
Shi, Yanling
论文数: 0引用数: 0
h-index: 0
机构:
East China Normal Univ, Dept Elect Engn, Shanghai 200241, Peoples R ChinaFudan Univ, Sch Microelect, Shanghai 200433, Peoples R China
机构:
Xidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Duan, Baoxing
Sun, Licheng
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机构:
Xidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Sun, Licheng
Dong, Ziming
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机构:
Xidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Dong, Ziming
Yang, Yintang
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Xidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China