Analysis of surface properties of Mg doped ZnS and ZnSe thin films through x-ray photoelectron spectroscopy

The surface properties of the spray-deposited Mg-doped ZnS and ZnSe films were investigated using X-ray photoelectron spectroscopy (XPS). The energy levels of the core electrons in ZnMgS and ZnMgSe, their peak positions, area ratios, and full width at half maximum were determined. Chemical shifts in Auger peaks, which are highly sensitive to changes in the chemical environment were used in the analysis. Compositional analysis indicated selenium deficiency in the ZnMgSe films. XPS peak of magnesium 2p showed a shift from 50.46 eV for ZnMgSe film to 50.63 eV for ZnMgS film and Mg 2s peak shift from 86.56 eV for ZnMgSe to 87.64 eV for ZnMgS films. A careful justification for the formation of oxides in the ZnMgSe films is also given. Ionicity for both films is about 0.51. Peak shifts in the Auger and core-level peaks are used to analyze the material's bonding strength, oxidation states, and bonding types.