Delayed feedback could either help or hurt test-enhanced learning; it depends

被引:0
|
作者
Nelson, Adin [1 ]
机构
[1] Weill Cornell Med, Dept Pediat, New York, NY 10065 USA
关键词
COGNITIVE LOAD;
D O I
10.1111/medu.15362
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
引用
收藏
页码:772 / 774
页数:3
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