Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy

被引:3
作者
Larsen, Matthew Helmi Leth [1 ]
Lomholdt, William Bang [2 ]
Valencia, Cuauhtemoc Nunez [1 ]
Hansen, Thomas W. [2 ]
Schiotz, Jakob [1 ]
机构
[1] Tech Univ Denmark, Dept Phys, Computat Atom Scale Mat Design CAMD, DK-2800 Lyngby, Denmark
[2] Tech Univ Denmark, Natl Ctr Nano Fabricat & Characterizat, DK-2800 Lyngby, Denmark
关键词
Machine learning; Modulation transfer function; Signal; -to; -noise; Beam damage; CCD CAMERAS; DETECTORS; ATOMS;
D O I
10.1016/j.ultramic.2023.113803
中图分类号
TH742 [显微镜];
学科分类号
摘要
Motivated by the need for low electron dose transmission electron microscopy imaging, we report the optimal frame dose (i.e. e-/& ANGS;2) range for object detection and segmentation tasks with neural networks. The MSD-net architecture shows promising abilities over the industry standard U-net architecture in generalising to frame doses below the range included in the training set, for both simulated and experimental images. It also presents a heightened ability to learn from lower dose images. The MSD-net displays mild visibility of a Au nanoparticle at 20-30 e- /& ANGS;2, and converges at 200 e- /& ANGS;2 where a full segmentation of the nanoparticle is achieved. Between 30 and 200 e-/& ANGS;2 object detection applications are still possible. This work also highlights the importance of modelling the modulation transfer function when training with simulated images for applications on images acquired with scintillator based detectors such as the Gatan Oneview camera. A parametric form of the modulation transfer function is applied with varying ranges of parameters, and the effects on low electron dose segmentation is presented.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Generalization Across Experimental Parameters in Neural Network Analysis of High-Resolution Transmission Electron Microscopy Datasets
    Sytwu, Katherine
    DaCosta, Luis Rangel
    Scott, Mary C.
    MICROSCOPY AND MICROANALYSIS, 2024, 30 (01) : 85 - 95
  • [2] High-Resolution Transmission Electron Microscopy on an Absolute Contrast Scale
    Thust, A.
    PHYSICAL REVIEW LETTERS, 2009, 102 (22)
  • [3] A review of sample thickness effects on high-resolution transmission electron microscopy imaging
    Li, Shouqing
    Chang, Yunjie
    Wang, Yumei
    Xu, Qiang
    Ge, Binghui
    MICRON, 2020, 130
  • [4] Laser-assisted sample preparation of silicon for high-resolution transmission electron microscopy
    Sakaguchi, Norihito
    Kozuka, Munehiro
    Ichinose, Hideki
    MICROSCOPY, 2015, 64 (02) : 111 - 119
  • [5] Reconstruction of the projected electrostatic potential in high-resolution transmission electron microscopy including phenomenological absorption
    Lentzen, M.
    ULTRAMICROSCOPY, 2010, 110 (05) : 517 - 526
  • [6] A robust synthetic data generation framework for machine learning in high-resolution transmission electron microscopy (HRTEM)
    Rangel DaCosta, Luis
    Sytwu, Katherine
    Groschner, C. K.
    Scott, M. C.
    NPJ COMPUTATIONAL MATERIALS, 2024, 10 (01)
  • [7] Exceeding Conventional Resolution Limits in High-Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit-Wave Restoration
    Haigh, Sarah J.
    Sawada, Hidetaka
    Takayanagi, Kunio
    Kirkland, Angus I.
    MICROSCOPY AND MICROANALYSIS, 2010, 16 (04) : 409 - 415
  • [8] Creating an infrastructure for high-throughput high-resolution cryogenic electron microscopy
    Shrum, Donald C.
    Woodruff, Brent W.
    Stagg, Scott M.
    JOURNAL OF STRUCTURAL BIOLOGY, 2012, 180 (01) : 254 - 258
  • [9] Study of structures at the boundary and defects in organic thin films of perchlorocoronene by high-resolution and analytical transmission electron microscopy
    Koshino, Masanori
    Kurata, Hiroki
    Isoda, Seiij
    ULTRAMICROSCOPY, 2010, 110 (12) : 1465 - 1474
  • [10] An improved Wiener deconvolution filter for high-resolution electron microscopy images
    Lin, Fang
    Jin, Chuanhong
    MICRON, 2013, 50 : 1 - 6