Coupled Process/Device Modeling and Point Defect Engineering of Cu(In,Ga)Se2 Solar Cells

被引:4
作者
Xiang, Xiaofeng [1 ]
Sommer, David E. [2 ]
Gehrke, Aaron [3 ]
Dunham, Scott T. [2 ]
机构
[1] Univ Washington, Mol Engn & Sci Inst, Seattle, WA 98195 USA
[2] Univ Washington, Dept Elect & Comp Engn, Seattle, WA 98195 USA
[3] Univ Washington, Dept Mat Sci & Engn, Seattle, WA 98195 USA
来源
IEEE JOURNAL OF PHOTOVOLTAICS | 2024年 / 14卷 / 03期
关键词
Copper; Selenium; Photovoltaic cells; Discrete Fourier transforms; Chemicals; Charge carrier processes; Mathematical models; Lifetime; point defect; process simulation; Shockley-Read-Hall (SRH) recombination; technology computer aided design (TCAD) model; OPTICAL-PROPERTIES; HIGH-EFFICIENCY; THIN-FILMS; CIGS; CHALCOPYRITES; SCATTERING; IMPACT;
D O I
10.1109/JPHOTOV.2024.3366652
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Point defects directly impact solar cell device performance by limiting the carrier lifetime. In this work, density functional theory calculations are first used to determine the formation energy and diffusion energy barriers of dominant defects in Cu(In,Ga)Se-2. Next, continuum reaction-diffusion models are developed to analyze the redistribution of defects during manufacturing processes. We estimate defect capture cross sections using a first-principles-based approach. These cross sections are combined with our calculated defect profiles and trap energy levels to parameterize a Shockley-Read-Hall recombination model, which we implement into a device simulator to predict carrier lifetimes and device performance. In that way, a predictive technology computer aided design model is built to predict and optimize the performance of Cu(In,Ga)Se-2 solar cells.
引用
收藏
页码:422 / 432
页数:11
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