Superior high temperature performance of 8 kV NiO/Ga2O3 vertical heterojunction rectifiers

被引:30
作者
Li, Jian-Sian [1 ]
Chiang, Chao-Ching [1 ]
Xia, Xinyi [1 ]
Wan, Hsiao-Hsuan [1 ]
Ren, Fan [1 ]
Pearton, S. J. [1 ,2 ]
机构
[1] Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA
[2] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32606 USA
关键词
Gallium compounds - High temperature applications - Nickel oxide - Schottky barrier diodes - Silicon carbide - Temperature;
D O I
10.1039/d3tc01200j
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
NiO/beta-Ga2O3 vertical rectifiers exhibit near-temperature-independent breakdown voltages (V-B) of >8 kV to 600 K. For 100 mu m diameter devices, the power figure of merit (V-B)(2)/R-ON, where R-ON is the on-state resistance, was 9.1 GW cm(-2) at 300 K and 3.9 GW cm(-2) at 600 K. By sharp contrast, Schottky rectifiers fabricated on the same wafers show V-B of similar to 1100 V at 300 K, with a negative temperature coefficient of breakdown of 2 V K-1. The corresponding figures of merit for Schottky rectifiers were 0.22 GW cm(-2) at 300 K and 0.59 MW cm(-2) at 600 K. The on-off ratio remained >10(10) up to 600 K for heterojunction rectifiers but was 3 orders of magnitude lower over the entire temperature range for Schottky rectifiers. The power figure of merit is higher by a factor of approximately 6 than the 1-D unipolar limit of SiC. The reverse recovery times were similar to 26 +/- 2 ns for both types of devices and were independent of temperature. We also fabricated large area, 1 mm(2) rectifiers. These exhibited V-B of 4 kV at 300 K and 3.6 kV at 600 K. The results show the promise of using this transparent oxide heterojunction for high temperature, high voltage applications.
引用
收藏
页码:7750 / 7757
页数:8
相关论文
共 59 条
[1]   Temperature-Dependent Characteristics of Ni/Au and Pt/Au Schottky Diodes on β-Ga2O3 [J].
Ahn, Shihyun ;
Ren, F. ;
Yuan, L. ;
Pearton, S. J. ;
Kuramata, A. .
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2017, 6 (01) :P68-P72
[2]   Ga2O3polymorphs: tailoring the epitaxial growth conditions [J].
Bosi, M. ;
Mazzolini, P. ;
Seravalli, L. ;
Fornari, R. .
JOURNAL OF MATERIALS CHEMISTRY C, 2020, 8 (32) :10975-10992
[3]   Temperature Dependence of Electron and Hole Impact Ionization Coefficients in GaN [J].
Cao, Lina ;
Zhu, Zhongtao ;
Harden, Galen ;
Ye, Hansheng ;
Wang, Jingshan ;
Hoffman, Anthony ;
Fay, Patrick J. .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (03) :1228-1234
[4]   Band alignment and electrical properties of NiO/?-Ga2O3 heterojunctions with different ?-Ga2O3 orientations [J].
Deng, Yuxin ;
Yang, Ziqi ;
Xu, Tongling ;
Jiang, Huaxing ;
Ng, Kar Wei ;
Liao, Chao ;
Su, Danni ;
Pei, Yanli ;
Chen, Zimin ;
Wang, Gang ;
Lu, Xing .
APPLIED SURFACE SCIENCE, 2023, 622
[5]   6 kV/3.4 mΩ.cm2 Vertical β-Ga2O3 Schottky Barrier Diode With BV2/Ron,sp Performance Exceeding 1-D Unipolar Limit of GaN and SiC [J].
Dong, Pengfei ;
Zhang, Jincheng ;
Yan, Qinglong ;
Liu, Zhihong ;
Ma, Peijun ;
Zhou, Hong ;
Hao, Yue .
IEEE ELECTRON DEVICE LETTERS, 2022, 43 (05) :765-768
[7]   β-Ga2O3 vertical heterojunction barrier Schottky diodes terminated with p-NiO field limiting rings [J].
Gong, H. H. ;
Yu, X. X. ;
Xu, Y. ;
Chen, X. H. ;
Kuang, Y. ;
Lv, Y. J. ;
Yang, Y. ;
Ren, F-F ;
Feng, Z. H. ;
Gu, S. L. ;
Zheng, Y. D. ;
Zhang, R. ;
Ye, J. D. .
APPLIED PHYSICS LETTERS, 2021, 118 (20)
[8]   A 1.86-kV double-layered NiO/β-Ga2O3 vertical p-n heterojunction diode [J].
Gong, H. H. ;
Chen, X. H. ;
Xu, Y. ;
Ren, F-F ;
Gu, S. L. ;
Ye, J. D. .
APPLIED PHYSICS LETTERS, 2020, 117 (02)
[9]   70-μM-Body Ga2O3 Schottky Barrier Diode W h 1.48 K/W Thermal Resistance, 59 A Surge Current and 98.9% Conversion Efficiency [J].
Gong, Hehe ;
Zhou, Feng ;
Yu, Xinxin ;
Xu, Weizong ;
Ren, Fang-Fang ;
Gu, Shulin ;
Lu, Hai ;
Ye, Jiandong ;
Zhang, Rong .
IEEE ELECTRON DEVICE LETTERS, 2022, 43 (05) :773-776
[10]   1.37 kV/12 A NiO/β-Ga2O3 Heterojunction Diode With Nanosecond Reverse Recovery and Rugged Surge-Current Capability [J].
Gong, Hehe ;
Zhou, Feng ;
Xu, Weizong ;
Yu, Xinxin ;
Xu, Yang ;
Yang, Yi ;
Ren, Fang-fang ;
Gu, Shulin ;
Zheng, Youdou ;
Zhang, Rong ;
Lu, Hai ;
Ye, Jiandong .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2021, 36 (11) :12213-12217