Heating samples to 2000 °C and above for scanning tunneling microscopy studies in ultrahigh vacuum

被引：0
|
作者：
Gedara, Buddhika S. A. [1 ]
Trenary, Michael [1 ]
机构：
[1] Univ Illinois, Dept Chem, 845 W Taylor St, Chicago, IL 60607 USA
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2024年 / 42卷 / 01期
基金：
美国国家科学基金会;
关键词：
ZRB2; SINGLE-CRYSTALS;
D O I：
10.1116/6.0003280
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A simple device for heating single-crystal samples to temperatures >= 2000 degrees C in ultrahigh vacuum that is compatible with the standard sample plates used in a common commercial scanning tunneling microscope (STM) is described. Heating high melting point samples to higher temperatures than is possible with many existing STM sample holders is necessary to obtain clean, well-ordered surfaces. Results are demonstrated for the (0001) surface of ZrB2, which has a melting point of 3050 degrees C.
引用
收藏
页数：8
相关论文
共 50 条
  • [1] ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPY STUDIES OF PLATINUM ON GRAPHITE
    CLARK, GW
    KESMODEL, LL
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (02): : 131 - 136
  • [2] Si nanowire growth with ultrahigh vacuum scanning tunneling microscopy
    Ono, T
    Saitoh, H
    Esashi, M
    APPLIED PHYSICS LETTERS, 1997, 70 (14) : 1852 - 1854
  • [3] A scanning tunneling microscopy observation of superperiodic features on graphite in ultrahigh vacuum
    Osing, J
    Shvets, IV
    ECASIA 97: 7TH EUROPEAN CONFERENCE ON APPLICATIONS OF SURFACE AND INTERFACE ANALYSIS, 1997, : 567 - 570
  • [4] AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE WITH INTERCHANGEABLE SAMPLES AND TIPS
    CHIANG, S
    WILSON, RJ
    GERBER, C
    HALLMARK, VM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 386 - 389
  • [5] Surface acoustic wave investigation by ultrahigh vacuum scanning tunneling microscopy
    Voigt, PU
    Krauss, S
    Chilla, E
    Koch, R
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2001, 19 (04): : 1817 - 1821
  • [6] Molecular electronics on silicon - An ultrahigh vacuum scanning tunneling microscopy study
    Guisinger, NP
    Basu, R
    Baluch, AS
    Hersam, MC
    MOLECULAR ELECTRONICS III, 2003, 1006 : 227 - 234
  • [7] A two-dimensional ultrahigh vacuum positioner for scanning tunneling microscopy
    Pond, K
    Nosho, BZ
    Stuber, HR
    Gossard, AC
    Weinberg, WH
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (03): : 1403 - 1405
  • [8] SURFACE ANALYTICAL SCANNING ELECTRON-MICROSCOPY IN ULTRAHIGH-VACUUM COMBINED WITH SCANNING TUNNELING MICROSCOPY
    ICHINOKAWA, T
    SURFACE AND INTERFACE ANALYSIS, 1990, 16 (1-12) : 87 - 96
  • [9] Delineation of pn junctions by scanning tunneling microscopy/ spectroscopy in air and ultrahigh vacuum
    Silver, R.M.
    Dagata, J.A.
    Tseng, W.
    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 1995, 13 (03): : 1705 - 1708
  • [10] Characterization and nanopatterning of organically functionalized graphene with ultrahigh vacuum scanning tunneling microscopy
    Qing Hua Wang
    Mark C. Hersam
    MRS Bulletin, 2011, 36 : 532 - 542
12345