Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy

被引：4

作者：

Axelrod, Jeremy J. ^{[1
,2
]}

Petrov, Petar N. ^{[1
,2
]}

Zhang, Jessie T. ^{[1
]}

Remis, Jonathan ^{[1
,2
]}

Buijsse, Bart ^{[3
]}

Glaeser, Robert M. ^{[2
,4
]}

Muller, Holger ^{[1
,2
]}

机构：

[1] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[2] Lawrence Berkeley Natl Lab, One Cyclotron Rd, Berkeley, CA 94720 USA

[3] Thermo Fisher Sci, Achtseweg Noord 5, NL-5651 GG Eindhoven, Netherlands

[4] Univ Calif Berkeley, Dept Mol & Cell Biol, Berkeley, CA 94720 USA

来源：

ULTRAMICROSCOPY | 2023年 / 249卷

基金：

美国国家卫生研究院;

关键词：

CRYO-EM; MOTION; NOISE;

D O I：

10.1016/j.ultramic.2023.113730

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We identify thermal magnetic field fluctuations, caused by thermal electron motion ("Johnson noise") in electrically conductive materials, as a potential resolution limit in transmission electron microscopy with a phase plate. Specifically, resolution loss can occur if the electron diffraction pattern is magnified to extend phase contrast to lower spatial frequencies, and if conductive materials are placed too close to the electron beam. While our initial implementation of a laser phase plate (LPP) was significantly affected by these factors, a redesign eliminated the problem and brought the performance close to the expected level. The resolution now appears to be limited by residual Johnson noise arising from the electron beam liner tube in the region of the LPP, together with the chromatic aberration of the relay optics. These two factors can be addressed during future development of the LPP.

引用

页数：6