Critical Thickness of Yttrium Iron Garnet Thin Films with Epitaxial Interface to Get Perpendicular Magnetic Anisotropy

被引：1

作者：

Ye, Zhao ^{[1
]}

Ling, Hanbing ^{[1
]}

Ling, Yu ^{[2
,3
]}

Fu, Qiuyun ^{[1
,4
]}

机构：

[1] Huazhong Univ Sci & Technol, Engn Res Ctr Funct Ceram, Sch Integrated Circuits, Minist Educ, Wuhan 430074, Peoples R China

[2] Huazhong Univ Sci & Technol, Wuhan Natl High Magnet Field Ctr, Wuhan 430074, Peoples R China

[3] Huazhong Univ Sci & Technol, Sch Phys, Wuhan 430074, Peoples R China

[4] Shenzhen Huazhong Univ Sci & Technol, Res Inst, Shenzhen 518000, Peoples R China

来源：

ACS APPLIED ELECTRONIC MATERIALS | 2024年 / 6卷 / 04期

基金：

中国国家自然科学基金;

关键词：

magnonic material; magneticanisotropy field; yttrium iron garnet; perpendicularmagnetic anisotropy; epitaxial films; low Gilbertdamping; FERROMAGNETIC-RESONANCE;

D O I：

10.1021/acsaelm.4c00031

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Minimizing the film thickness is the foundation to make devices smaller for practical applications. Here, we explore the critical thickness of yttrium iron garnet (YIG) films to obtain perpendicular magnetic anisotropy and analyze the mechanism behind. YIG film with robust perpendicular magnetic anisotropy and fine epitaxial interface is prepared. The effective field is as large as -1396 and -1758 Oe in 3.6 and 6 nm YIG films, respectively, indicating large perpendicular magnetic anisotropy in these two films. More importantly, the large strain-induced in-plane cubic magnetic anisotropy field of about 2068 Oe in 3 nm thick film is the main cause of the decay in perpendicular magnetic anisotropy. The YIG thickness at 3.6 nm is the minimum perpendicular in YIG films grown on YSGG substrates.

引用

页码：2369 / 2374

页数：6

共 31 条

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