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High-temperature resistivity in rare-earth nickelates films
被引:0
|作者:
Stupakov, Alexandr
[1
]
Kocourek, Tomas
[1
]
de Prado, Esther
[1
]
More-Chevalier, Joris
[1
]
Vetokhina, Volha
[1
]
Dejneka, Alexandr
[1
]
Tyunina, Marina
[1
,2
]
机构:
[1] Czech Acad Sci, Inst Phys, Slovance 2, Prague 18200, Czech Republic
[2] Univ Oulu, Fac Informat Technol & Elect Engn, Microelect Res Unit, POB 4500, FI-90014 Oulu, Finland
关键词:
Rare-earth nickelate;
Perovskite oxide;
Hopping conductivity;
Small polaron;
Metal-insulator transition;
METAL-INSULATOR-TRANSITION;
THIN-FILMS;
NONSTOICHIOMETRY;
GROWTH;
D O I:
10.1016/j.jmmm.2023.171256
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We expand the temperature interval of the resistivity measurement to clarify the charge transport mechanisms in the rare-earth nickelates ReNiO3. Thin films of LaNiO3 demonstrate an expected metallic behavior at high temperatures: a perfect linear rise of the resistivity rho proportional to T is confirmed above room temperature. However, NdNiO3 films characterized by a sharp metal-to-insulator transition display a noticeable deviation of their high-temperature resistivity from the metallic linear relation. This deviation is suggested to originate from an additional thermally activated hopping transport. High-temperature hopping conductivity is also found in SmNiO3 films. Carrier localization due to disorder and the formation of small polarons is discussed as being responsible for hopping.
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