Lateral Bending of Ag Nanowires toward Controllable Manipulation

Nanowires(NWs) provide opportunities for building high-performancesensors and devices at micro-/nanoscales. Directional movement andassembly of NWs have attracted extensive attention; however, controllablemanipulation remains challenging partly due to the lack of understandingon interfacial interactions between NWs and substrates (or contactingprobes). In the present study, lateral bending of Ag NWs was investigatedunder various bending angles and pushing velocities, and the mechanicalperformance corresponding to microstructures was clarified based onhigh-resolution transmission electron microscope (HRTRM) detections.The bending-angle-dependent fractures of Ag NWs were detected by anatomic force microscope (AFM) and a scanning electron microscope (SEM),and the fractures occurred when the bending angle was larger than80 degrees. Compared with an Ag substrate, Ag NWs exhibited a lowersystem stiffness according to the nanoindentation with an AFM probe.HRTRM observations indicated that there were grain boundaries insideAg NWs, which would be contributors to the generation of fracturesand cracks on Ag NWs during lateral bending and nanoindentation. Thisstudy provides a guide to controllably manipulate NWs and fabricatehigh-performance micro-/nanodevices.