Refractive index and optical dielectric function of CdTe 0.9 Se 0.1 thin film produced by quasi-closed sublimation

Optical constants, dispersion and oscillator parameters of CdTe (0.9) Se (0.1) thin film deposited onto quartz substrates by the quasi close-space sublimation method is studied. The study of optical functions is performed on the basis of the experimentally measured transmission spectrum by the Swanepoel method. The spectral behavior of optical functions, such as refractive index and dielectric functions is established. The refractive index was extrapolated by the Cauchy and Sellmeier dispersion relationships over the spectral range from 900 to 2500 nm. The dispersion of the refractive index is discussed in terms of the Wemple and Di Domenico single oscillator model. The spectral behavior of optical dielectric functions was studied in the framework of the Drude free electron model. For a thin CdTe (0.9) Se (0.1) film, the optical mobility, optical resistance, relaxation time, plasma frequency, and carrier concentration are determined for the first time.