Sm-doping driven state-phase transition and energy storage capability in lead-free Ba(Zr0.35Ti0.65)O3 films

被引:7
|
作者
Vu, Hien T. [1 ]
Vu, Hung N. [1 ]
Rijnders, Guus [2 ]
Nguyen, Minh D. [1 ,2 ]
机构
[1] Hanoi Univ Sci & Technol, Int Training Inst Mat Sci, 1 Dai Co Viet Rd, Hanoi, Vietnam
[2] Univ Twente, MESA Inst Nanotechnol, POB 217, NL-7500 AE Enschede, Netherlands
关键词
Doping engineering; Paraelectric behavior; Nanodomains; Energy-storage; Lead-free environmentally friendly; BARIUM-TITANATE; THIN-FILMS; GRAIN-BOUNDARY; DENSITY; CERAMICS; EFFICIENCY; BREAKDOWN; PERFORMANCE; ENHANCEMENT; CAPACITORS;
D O I
10.1016/j.jallcom.2023.171837
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The stability of high energy-storage performance dielectric-film capacitors with respect to frequency, temperature, and cycle number is very essential for developing energy-storage devices. Here, the impact of Sm-doping concentration on the structure and energy-storage stability of lead-free Ba(Zr0.35Ti0.65)O3 (BZT) films have been systematically investigated. The formation of random electric fields, due to the co-occupying heterovalent ions of Sm3+/Ti4+ at the B-sites, serves to enhance the breakdown strength and reduce the polarization reversibility. As a result, an enhanced recoverable energy-storage density of 133.3 J/cm3 and an excellent energy efficiency of 89.4% are simultaneously achieved in 25 mol% Sm-doped BZT films (BZT-Sm25) under an applied electric field of 7.0 MV/cm. In addition, the BZT-Sm25 films also exhibit outstanding energy-storage performance stability over a large frequency-range of 1-1000 Hz, a wide temperature-range of 25 degrees C-200 degrees C, and beyond 1010 switching-cycles, even under a high electric field of 6 MV/cm. These achieved results demonstrate that the Smdoped BZT films are promising candidates for the development of high-performance and environmentally friendly energy-storage devices.
引用
收藏
页数:9
相关论文
共 50 条
  • [11] Dielectric nonlinear characteristics of Ba(Zr0.35Ti0.65)O3 thin films grown by a sol-gel process
    Zhai, JW
    Yao, X
    Zhang, LY
    Shen, B
    APPLIED PHYSICS LETTERS, 2004, 84 (16) : 3136 - 3138
  • [12] Dielectric and Ferroelectric Properties of Ba(Zr0.35Ti0.65)O3 Thin Films Grown by a Sol-Gel Process
    Zhai Jiwei
    Yao Xi
    Shen Bo
    Zhang Liangying
    Haydn Chen
    Journal of Electroceramics, 2003, 11 (3) : 157 - 161
  • [13] Origin and implications of the observed rhombohedral phase in nominally tetragonal Pb(Zr0.35Ti0.65)O3 thin films
    Kelman, MB
    McIntyre, PC
    Gruverman, A
    Hendrix, BC
    Bilodeau, SM
    Roeder, JF
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (08) : 5210 - 5219
  • [14] Origin and implications of the observed rhombohedral phase in nominally tetragonal Pb(Zr0.35Ti0.65)O3 thin films
    Kelman, M.B. (maxkel@stanford.edu), 1600, American Institute of Physics Inc. (94):
  • [15] Subpicosecond Domain Switching in Discrete Regions of Pb(Zr0.35Ti0.65)O3 Thick Films
    Jiang, An Quan
    Chen, Zhi Hui
    Hui, Wen Yuan
    Wu, Dongping
    Scott, James F.
    ADVANCED FUNCTIONAL MATERIALS, 2012, 22 (10) : 2148 - 2153
  • [16] Observation of hybrid solid solution and superior energy storage in 0.8Ba(Zr0.35Ti0.65)O3-0.2ZnO films
    Zhang, Xiaoyu
    Pang, Zhentao
    Ding, Wenjuan
    Zhou, Jinfeng
    Jiao, Peijie
    Xiong, Ke
    Luo, Jin
    Deng, Yu
    Zhang, Shan-Tao
    APPLIED PHYSICS LETTERS, 2023, 123 (08)
  • [17] Effect of external mechanical stress on the domain structure of Pb(Zr0.35Ti0.65)O3 thin films
    Li, LB
    Wu, XM
    Lu, XM
    Zhu, JS
    SOLID STATE COMMUNICATIONS, 2005, 135 (11-12) : 703 - 706
  • [18] Energy storage in lead-free Ba(Zr, Ti)O3 relaxor ferroelectrics: Large densities and efficiencies and their origins
    Jiang, Zhijun
    Prosandeev, Sergey
    Bellaiche, L.
    PHYSICAL REVIEW B, 2022, 105 (02)
  • [19] Effect of applied mechanical strain on the ferroelectric and dielectric properties of Pb(Zr0.35Ti0.65)O3 thin films
    Kelman, MB
    McIntyre, PC
    Hendrix, BC
    Bilodeau, SM
    Roeder, JF
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (11) : 9231 - 9236
  • [20] Frequency dependence of the dielectric properties of La-doped Pb(Zr0.35Ti0.65)O3 thin films
    Zhang, ZG
    Chu, DP
    McGregor, BM
    Migliorato, P
    Ohashi, K
    Hasegawa, K
    Shimoda, T
    APPLIED PHYSICS LETTERS, 2003, 83 (14) : 2892 - 2894