Chemical Vapor Deposition of Monolayer MoS2 on Chemomechanically Polished N-Polar GaN for Future 2D/3D Heterojunction Optoelectronics

被引:4
|
作者
Sengupta, Rohan [1 ]
Vaidya, Shipra [1 ]
Szymanski, Dennis [1 ]
Khachariya, Dolar [2 ]
Bockowski, Michal [3 ]
Kamler, Grzegorz [3 ]
Reddy, Pramod [2 ]
Sitar, Zlatko [1 ]
Collazo, Ramon [1 ]
Pavlidis, Spyridon [1 ]
机构
[1] North Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USA
[2] Adroit Mat, Cary, NC 27518 USA
[3] Polish Acad Sci, Inst High Pressure Phys, PL-01142 Warsaw, Poland
关键词
N-polar; gallium nitride; chemomechanical polishing; MoS; 2; monolayer; chemical vapor deposition; GROWTH; BAND;
D O I
10.1021/acsanm.3c00038
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The growth of monolayer MoS2 crystals on chemomechanically polished (CMP) N-polar GaN using PTAS-assisted chemical vapor deposition is demonstrated. The formation of monolayer MoS2 was initially prevented by the as-grown GaN’s large surface roughness. CMP reduces the roughness to 250 pm, enabling monolayer MoS2 triangles with edge lengths of 30 μm, a Raman peak separation of <20 cm-1, and an optical bandgap of 1.81 eV, which is on par with those obtained on smooth Ga-polar GaN. It is thus demonstrated that high-quality MoS2 monolayers can be obtained on N-polar GaN for future high-speed optoelectronic and quantum sensing applications. © 2023 American Chemical Society.
引用
收藏
页码:5081 / 5086
页数:6
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