Reference-free self-calibrating tip-based scattering-type THz near-field microscopy

被引:3
作者
Moon, Y. [1 ]
Lee, H. [1 ]
Lim, J. [1 ,4 ]
Lee, G. [2 ]
Kim, J. [3 ]
Han, H. [1 ]
机构
[1] Pohang Univ Sci & Technol, Dept Elect Engn, Pohang 37673, South Korea
[2] Korea Food Res Inst, Smart Food Mfg Project Grp, Wonju 55365, South Korea
[3] Univ Arkansas, Dept Biol & Agr Engn, Fayetteville, AR 72701 USA
[4] Univ Arkansas, Inst Nanosci & Engn, Fayetteville, AR 72701 USA
关键词
INFRARED-ABSORPTION; DIELECTRIC FUNCTION; ANALYTICAL-MODEL; RESOLUTION; SPECTROSCOPY; CONTRAST; INDEX; FILMS;
D O I
10.1063/5.0152141
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, we present a quantitative analysis model based on reference-free self-calibration to analyze scattered fields and approach curves on a dielectric substrate for terahertz scattering-type scanning near-field optical microscopy. The results of our model are compared with experimentally measured data and a fully numerical analysis based on a line dipole image method and a quasi-electrostatic approximation. The model is used to extract the effective radius of the tip and the relative permittivity of the silicon substrate to the near-field scattering signal. The measured approach curves on Au and silicon substrates show good agreement with the calculated approach curves, and the refractive index for silicon is precisely determined to be 3.42. For a tip-based THz scattering-type scanning near-field optical microscope, the proposed analysis model allows for the extraction of the effective probe radius and dielectric functions, thereby enabling conclusive measurements of geometric parameters and optical constants.
引用
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页数:6
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