Improved polarization retention in epitaxial BiFeO3 thin films induced by strain relaxation

This study investigated the impact of lattice mismatch strain (LMS) on the polarization retention of epitaxial ferroelectric BiFeO3 (BFO) thin films. The application of varying degrees of LMS on the BFO films was achieved by tuning the film thickness, which was verified through X-ray diffraction and reciprocal space mapping. As the strain was gradually eliminated, the film demonstrated a more saturated hysteresis loop with a reduced negative coercive electric field. Additionally, a significant increase in polarization retention was observed with increasing film thickness, strongly indicating the crucial role of LMS in driving the formation of preferred polarization, which is intimately connected with the built-in field induced by oxygen vacancies-relevant space charge alignment. Moreover, the anisotropic LMS state of the BFO films was utilized to horizontally reverse local polarization in a sub-micrometer scale, revealing that strain accelerates the back-switching of polarization to eliminate the artificially created ferroelastic domain walls. To counteract the strain effect, charge injection of electrons was proposed to enhance the retention of switched polarization by fully suppressing the built-in field and pinning the artificially created domain walls. The findings provide valuable insights into the impact of strain on polarization retention for the development of ferroelectric memories.