Coherent diffractive imaging with twisted X-rays: Principles, applications, and outlook

被引:2
作者
Nazirkar, Nimish P. [1 ]
Shi, Xiaowen [1 ]
Shi, Jian [1 ,2 ]
N'Gom, Moussa [2 ]
Fohtung, Edwin [1 ,2 ,3 ]
机构
[1] Rensselaer Polytech Inst, Dept Mat Sci & Engn, 110 8th St, Troy, NY 12180 USA
[2] Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, 110 8th St, Troy, NY 12180 USA
[3] Rensselaer Polytech Inst, Ctr Mat Devices & Integrated Syst, Troy, NY 12180 USA
来源
APPLIED PHYSICS REVIEWS | 2024年 / 11卷 / 02期
关键词
PHASE-RETRIEVAL ALGORITHMS; PHOTON-CORRELATION SPECTROSCOPY; CROSS-CORRELATION ANALYSIS; MAGNETIC-MATERIALS; LATTICE-DYNAMICS; DEFECT DYNAMICS; LOCAL-STRUCTURE; WAVE-FIELDS; SCATTERING; STRAIN;
D O I
10.1063/5.0179765
中图分类号
O59 [应用物理学];
学科分类号
摘要
Recent technological breakthroughs in synchrotron and x-ray free electron laser facilities have revolutionized nanoscale structural and dynamic analyses in condensed matter systems. This review provides a comprehensive overview of the advancements in coherent scattering and diffractive imaging techniques, which are now at the forefront of exploring materials science complexities. These techniques, notably Bragg coherent diffractive imaging and x-ray photon correlation spectroscopy, x-ray magnetic dichroism, and x-ray correlation analysis leverage beam coherence to achieve volumetric three-dimensional imaging at unprecedented sub-nanometer resolutions and explore dynamic phenomena within sub-millisecond timeframes. Such capabilities are critical in understanding and developing advanced materials and technologies. Simultaneously, the emergence of chiral crystals-characterized by their unique absence of standard inversion, mirror, or other roto-inversion symmetries-presents both challenges and opportunities. These materials exhibit distinctive interactions with light, leading to phenomena such as molecular optical activity, chiral photonic waveguides, and valley-specific light emissions, which are pivotal in the burgeoning fields of photonic and spintronic devices. This review elucidates how novel x-ray probes can be leveraged to unravel these properties and their implications for future technological applications. A significant focus of this review is the exploration of new avenues in research, particularly the shift from conventional methods to more innovative approaches in studying these chiral materials. Inspired by structured optical beams, the potential of coherent scattering techniques utilizing twisted x-ray beams is examined. This promising direction not only offers higher spatial resolution but also opens the door to previously unattainable insights in materials science. By contextualizing these advancements within the broader scientific landscape and highlighting their practical applications, this review aims to chart a course for future research in this rapidly evolving field.
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页数:25
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