Origin of orbital magnetic moment in e-beam evaporated SrRuO3 thin films studied by soft X-ray magnetic circular dichroism

被引:1
作者
Jena, S. [1 ]
Kumari, A. [1 ]
Dawn, R. [1 ]
Hussain, A. [1 ]
Verma, V. K. [2 ]
Gardner, H. J.
Aabdin, Z. [3 ]
Amemiya, K. [4 ]
Singh, V. R. [1 ]
机构
[1] Cent Univ South Bihar, Dept Phys, Gaya 824236, Bihar, India
[2] VIT AP Univ, Sch Adv Sci, Dept Phys, Amaravati 522237, AP, India
[3] ASTAR, Inst Mat Res & Engn, Singapore 138634, Singapore
[4] High Energy Accelerator Res Org, Photon Factory, IMSS, Tsukuba, Ibaraki 3050801, Japan
关键词
Thin films; XMCD; XAS; Ferromagnetism and orbital magnetic; moments; ANISOTROPY;
D O I
10.1016/j.jallcom.2023.169740
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Depending on the epitaxial strain, the ferromagnetic thin film SrRuO3 (SRO) prepared by e-beam eva-poration, exhibits variable easy magnetization axes, and shows a metal-insulator transition as the thickness of the thin film decreases. We investigated the magnetic properties of SRO thin films produced on SrTiO3 (001) substrates in a series of thicknesses utilizing soft x-ray magnetic circular dichroism at the Ru M2,3 edge. Results have demonstrated that when film thickness decreases to around five monolayers, the film transitions from ferromagnetic to nonmagnetic, consistent with measurements of the magnetization. The spin magnetic moment also decreases with decreasing film thickness. A method for obtaining the orbital magnetic moment is discussed using the electronic structure of the comparatively strained SRO thin film.(c) 2023 Elsevier B.V. All rights reserved.
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页数:8
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