Role of Si segregation in the structural, mechanical, and compositional evolution of high-temperature oxidation resistant Cr-Si-B2? z thin films

被引:7
作者
Zauner, L. [1 ]
Steiner, A. [1 ]
Glechner, T. [1 ]
Bahr, A. [1 ]
Ott, B. [2 ]
Hahn, R. [1 ]
Wojcik, T. [1 ,3 ]
Hunold, O. [4 ]
Ramm, J. [4 ]
Kolozsvari, S. [5 ]
Polcik, P. [5 ]
Felfer, P. [2 ]
Riedl, H. [1 ,3 ]
机构
[1] TU Wien, Christian Doppler Lab Surface Engn High Performan, Vienna, Austria
[2] Friedrich Alexander Univ Erlangen Nurnberg, Dept Mat Sci, Erlangen, Germany
[3] TU Wien, Inst Mat Sci & Technol, Vienna, Austria
[4] Oerlikon Surface Solut AG, Oerlikon Balzers, Balzers, Liechtenstein
[5] Plansee Composite Mat GmbH, Lechbruck, Germany
关键词
Borides; Thin films; Si alloying; Oxidation resistance; Phase stability; Mechanical properties; Segregation; CERAMICS; STABILITY; ZRB2; DIBORIDES; COATINGS; HARDNESS;
D O I
10.1016/j.jallcom.2023.169203
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This work investigates the influence of Si-alloying up to 17 at.% on the structural, mechanical, and oxidation properties of magnetron sputtered CrB2 +/- z-based thin films. Density-functional theory calculations combined with atom probe tomography reveal the preferred Si occupation of Cr-lattice sites and an effective solubility limit between 3 to 4 at.% in AlB2-structured solid solutions. The addition of Si results in refinement of the columnar morphology, accompanied by enhanced segregation of excess Si along grain boundaries. The microstructural separation leads to a decrease in both film hardness and Young's modulus from H - 24 to 17 GPa and E - 300 to 240 GPa, respectively, dominated by the inferior mechanical properties of the intergranular Si-rich regions. Dynamic thermogravimetry up to 1400 degrees C reveals a significant increase in oxidation onset temperature from 600 to 1100 degrees C above a Si content of 8 at.%. In-situ X-ray diffraction correlates the protective mechanism with thermally activated precipitation of Si from the Cr-SiB2 +/- z solid solution at 600 degrees C, enabling the formation of a stable, nanometer-sized SiO2-based scale. Moreover, high-resolution TEM analysis exposes the scale architecture after dynamic oxidation to 1200 degrees C (10 K/min heating rate) - consisting only of -20 nm amorphous SiO2 beneath -200 nm of nanocrystalline Cr2O3. In summary, the study provides detailed guidelines connecting the chemical composition with the respective thin film properties of high-temperature oxidation resistant Cr-Si-B2 +/- z coatings. (c) 2023 The Author(s). Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
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页数:11
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