Data acquisition in powder X-ray diffraction measurements using an area detector

被引:1
|
作者
Zheng, Xu [1 ,2 ]
Yin, Guangzhi [2 ]
Qiu, Zhiyong [1 ]
Yang, Tieying [2 ]
Gao, Xingyu [2 ]
Gu, Yueliang [2 ]
Zhang, Xingmin [2 ]
Li, Xiaolong [2 ]
机构
[1] Dalian Univ Technol, Sch Mat Sci & Engn, Key Lab Mat Modificat Laser Ion & Electron Beams, Minist Educ, Dalian 116024, Peoples R China
[2] Chinese Acad Sci, Shanghai Adv Res Inst, Shanghai Synchrotron Radiat Facil SSRF, 239 Zhangheng Rd, Shanghai, Peoples R China
基金
中国国家自然科学基金;
关键词
Area detector; powder X-ray diffraction (XRD); splice; MULTI-ANALYZER STAGE; SCATTERING DATA; EIGER DETECTOR; PERFORMANCE;
D O I
10.1080/10739149.2023.2297087
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Area detectors have been widely used in X-ray diffraction (XRD) to improve the acquisition speed and data quality. Here, an accurate, high efficiency, low distortion approach with a large angle range for collecting powder X-ray diffraction data is developed which is carried out by rotating a small area detector on the detector arm of the diffractometer. A series of collected images are spliced and converted into one 1D XRD pattern. The calculation of the 2 theta value and intensity corresponding to every pixel are shown in detail. The calibration of the detector and experimental geometry was carried out. Finally, the reliability of this method has been demonstrated by the X-ray diffraction measurements of a standard LaB6 powder and Rietveld refinement results.
引用
收藏
页码:597 / 608
页数:12
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