C-band operating plasmonic sensor with a high Q-factor/figure of merit based on a silicon nano-ring

被引:4
作者
Cicek, Kenan [1 ,2 ]
Boybay, Muhammed S. [1 ]
Topkaya, Ramazan [1 ]
Agarwal, Anuradha M. [2 ]
机构
[1] Igdir Univ, Dept Elect Elect Engn, Suveren Campus, TR-76000 Igdir, Turkiye
[2] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
关键词
SENSITIVITY ENHANCEMENT; RESONANCE;
D O I
10.1364/AO.480642
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper, we take advantage of the high refractive index property of silicon to design a practical and sensitive plasmonic sensor on a photonic integrated circuit (PIC) platform. It has been demonstrated that a label-free refrac-tive index sensor with sensitivity up to 1124 nm/RIU can be obtained using a simple design of a silicon nano-ring with a concentric hexagonal plasmonic cavity. It has also been shown that, with optimum structural parameters, a quality factor (Q-factor) of 307 and a figure of merit (FOM) of 234 RIU-1 can be achieved, which are approxi-mately 8 times and 5 times higher than the proposed sensors counterparts, respectively. In addition, the resonance mode of the hexagonal cavity with Si nano-ring (HCS) sensor can be adjusted to operate in the C-band, which is a highly desirable wavelength range in terms of compatibility with devices in PIC technology. (c) 2023 Optica Publishing Group
引用
收藏
页码:1290 / 1295
页数:6
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