Deep Learning-based Artificial Neural Network Object Detection Methods for Inspection of Hazardous Items

被引:0
作者
Jeong, Ji-Wook [1 ]
Song, Yoonseon [1 ]
Lee, Sooyeul [1 ]
机构
[1] Elect & Telecommun Res Inst, Daejeon, South Korea
关键词
Hazardous Item Inspection; Object Detection; Artificial Neural Network;
D O I
10.7779/JKSNT.2023.43.4.259
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
To detect hazardous materials within cargo passing through ports and airports, X-ray images are captured and inspected by human screeners. However, to ensure detection accuracy and consistency, various object detection algorithms using deep learning neural networks are being applied in the video search for pre-screening of dangerous items. In this study, various detector algorithms, such as Faster R-CNN, PAA, and D2Det, with the Vision Transformer (ViT) backbone, were applied for detecting hazardous objects within X-ray baggage images. Additionally, several training techniques, including self-supervised learning methods like Soft Teacher, MAE, and SimMIM, as well as transfer learning from pretrained models using techniques like DeiT and BEiT, were analyzed to improve the detection performance. When applied for object detection using the SIXray dataset, the D2Det detector with multiway Swin Transformer backbone exhibited a detection performance with mean average precision (mAP0.5) of 86.1%, while the Faster R-CNN detector with ViT backbone pretrained with BEiT exhibited a detection performance with mAP0.5 of 85.5%.
引用
收藏
页码:259 / 267
页数:9
相关论文
共 25 条
[1]  
Andriyanov N., 2023, ENG P, V33, P20
[2]  
Bao H., 2021, arXiv, DOI DOI 10.48550/ARXIV.2106.08254
[3]  
Cao JL, 2020, PROC CVPR IEEE, P11482, DOI 10.1109/CVPR42600.2020.01150
[4]  
Chen K, 2019, Arxiv, DOI arXiv:1906.07155
[5]  
Chen Z, 2023, Arxiv, DOI arXiv:2205.08534
[6]  
Dosovitskiy A, 2021, Arxiv, DOI arXiv:2010.11929
[7]   Masked Autoencoders Are Scalable Vision Learners [J].
He, Kaiming ;
Chen, Xinlei ;
Xie, Saining ;
Li, Yanghao ;
Dollar, Piotr ;
Girshick, Ross .
2022 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2022), 2022, :15979-15988
[8]   Deep Residual Learning for Image Recognition [J].
He, Kaiming ;
Zhang, Xiangyu ;
Ren, Shaoqing ;
Sun, Jian .
2016 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2016, :770-778
[9]  
Kang Kim, 2020, Computer Vision - ECCV 2020. 16th European Conference. Proceedings. Lecture Notes in Computer Science (LNCS 12370), P355, DOI 10.1007/978-3-030-58595-2_22
[10]   SHOMY: Detection of Small Hazardous Objects using the You Only Look Once Algorithm [J].
Kim, Eunchan ;
Lee, Jinyoung ;
Jo, Hyunjik ;
Na, Kwangtek ;
Moon, Eunsook ;
Gweon, Gahgene ;
Yoo, Byungjoon ;
Kyung, Yeunwoong .
KSII TRANSACTIONS ON INTERNET AND INFORMATION SYSTEMS, 2022, 16 (08) :2688-2703