Study of the Structural, Electrical, and Mechanical Properties and Morphological Features of Y-Doped CeO2 Ceramics with Porous Structure

被引:5
作者
Shakirzyanov, Rafael I. [1 ]
Volodina, Natalia O. [1 ]
Kozlovskiy, Artem L. [1 ,2 ]
Zdorovets, Maxim V. [1 ,2 ]
Shlimas, Dmitriy I. [1 ,2 ]
Borgekov, Daryn B. [1 ,2 ]
Garanin, Yuriy A. [1 ]
机构
[1] LN Gumilyov Eurasian Natl Univ, Engn Profile Lab, Satpayev St, Astana 010008, Kazakhstan
[2] Inst Nucl Phys, Lab Solid State Phys, Alma Ata 050032, Kazakhstan
来源
JOURNAL OF COMPOSITES SCIENCE | 2023年 / 7卷 / 10期
关键词
ceria ceramics; permittivity; microhardness; porous ceramics; solid-state sintering; DIELECTRIC-PROPERTIES; CATION DISTRIBUTION; PHASE-RELATIONS; X-RAY; CERIA; RAMAN; FUEL; CONDUCTIVITY; SYSTEM;
D O I
10.3390/jcs7100411
中图分类号
TB33 [复合材料];
学科分类号
摘要
In this work, ceramic samples of cerium oxide doped with yttrium were investigated. The concentration of a dopant Y(NO3)(3) varied from 5 to 25 wt% in the initial charge. In the course of the experiment, a simple method was developed to obtain ceramics with a porosity of similar to 20% via one-step annealing in air in a muffle furnace. For comparison, samples with two annealings were also synthesized to determine the effects of pores on electrical, structural, and mechanical characteristics. The obtained samples were examined via X-ray powder diffraction, scanning electron microscopy, X-ray energy dispersive spectroscopy, Raman spectroscopy, dielectric spectroscopy, and Vickers microhardness measurements. The substitution of Ce4+ ions with Y3+ ions led to a significant decrease in the lattice parameter, average crystallite size, and average grain size, with a simultaneous increase in the lattice defectivity, dielectric constant, electrical conductivity, and microhardness values. It is shown that samples with a dopant weight fraction of 0.05-0.15 and one-step annealing have favorable electrical and mechanical characteristics for energy applications as porous materials with ionic conductivity.
引用
收藏
页数:19
相关论文
共 51 条
[31]   DEFECT-INDUCED RAMAN-SPECTRA IN DOPED CEO2 [J].
NAKAJIMA, A ;
YOSHIHARA, A ;
ISHIGAME, M .
PHYSICAL REVIEW B, 1994, 50 (18) :13297-13307
[32]   X-ray diffraction analysis by Williamson-Hall, Halder-Wagner and size-strain plot methods of CdSe nanoparticles- a comparative study [J].
Nath, Debojyoti ;
Singh, Fouran ;
Das, Ratan .
MATERIALS CHEMISTRY AND PHYSICS, 2020, 239 (239)
[33]   An Evaluation of the Thermophysical Properties of Stoichiometric CeO2 in Comparison to UO2 and PuO2 [J].
Nelson, Andrew T. ;
Rittman, Dylan R. ;
White, Joshua T. ;
Dunwoody, John T. ;
Kato, Masato ;
McClellan, Kenneth J. .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2014, 97 (11) :3652-3659
[34]   Suppressing the Loss of Polymer-Based Dielectrics for High Power Energy Storage [J].
Pei, Jia-Yao ;
Yin, Li-Juan ;
Zhong, Shao-Long ;
Dang, Zhi-Min .
ADVANCED MATERIALS, 2023, 35 (03)
[35]  
Rahaman M.N., 2007, SINTERING CERAMICS
[36]   The relationship between microstructure and fracture toughness of zirconia toughened alumina (ZTA) added with MgO and CeO2 [J].
Rejab, Nik Akmar ;
Azhar, Ahmad Zahirani Ahmad ;
Ratnam, Mani Maran ;
Ahmad, Zainal Arifin .
INTERNATIONAL JOURNAL OF REFRACTORY METALS & HARD MATERIALS, 2013, 41 :522-530
[37]   ImageJ2: ImageJ for the next generation of scientific image data [J].
Rueden, Curtis T. ;
Schindelin, Johannes ;
Hiner, Mark C. ;
DeZonia, Barry E. ;
Walter, Alison E. ;
Arena, Ellen T. ;
Eliceiri, Kevin W. .
BMC BIOINFORMATICS, 2017, 18
[38]   Microstrain and self-limited grain growth in nanocrystalline ceria ceramics [J].
Rupp, JLM ;
Infortuna, A ;
Gauckler, LJ .
ACTA MATERIALIA, 2006, 54 (07) :1721-1730
[39]   Localization of Yttrium Segregation within YSZ Grain Boundary Dislocation Cores [J].
Sanchez-Santolino, Gabriel ;
Salafranca, Juan ;
Pantelides, Sokrates T. ;
Pennycook, Stephen J. ;
Leon, Carlos ;
Varela, Maria .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2018, 215 (19)
[40]   Effect of Polaron formation in conduction and dielectric behavior in La0.7Sr0.25K0.05MnO3 oxide [J].
Selmi, Marwa ;
Smida, Amor ;
Kossi, Safwen El .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2021, 32 (05) :6014-6027