Direct calibration of indenter tip geometry by optical surface topography measuring instruments

被引:2
|
作者
Maculotti, Giacomo [1 ]
Kholkhujaev, Jasurkhuja [1 ,2 ]
Genta, Gianfranco [1 ]
Galetto, Maurizio [1 ]
机构
[1] Politecn Torino, Dept Management & Prod Engn, Corso Duca Abruzzi 24, I-10129 Turin, Italy
[2] Turin Polytech Univ Tashkent, Kichik Halka Yuli 17, Tashkent, Uzbekistan
关键词
Instrumented indentation test; Nanoindentation; Calibration; Measurement uncertainty; Indenter geometry; Area shape function; ELASTIC-MODULUS; COATED TOOLS; INDENTATION; NANOINDENTATION; HARDNESS; PERFORMANCE;
D O I
10.1557/s43578-023-01063-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Instrumented indentation test (IIT) is a depth-sensing hardness test allowing nano- to macro-mechanical characterisation of surface mechanical properties. Indenter tip geometry calibration allows nano-scale characterisation, overcoming the limits of conventional hardness tests. Calibration is critical to ensure IIT traceability and applicability for quality verification in manufacturing processes. The accuracy and precision of IIT are mainly affected by the indenter tip geometry calibration. State-of-the-art indenter tip geometry calibration reports either direct calibration by AFM, which is highly expensive and unpractical for industry, or indirect calibration methods, which are less accurate, precise and robust. This work proposes a practical, direct calibration method for IIT indenter tip geometry by optical surface topography measuring instruments. The methodology is complemented by uncertainty evaluation. The proposed approach is applied to Berkovich and Vickers indenters and its advantages are proven in terms of accuracy and precision of mechanical characterisation on metallic and ceramic material.
引用
收藏
页码:3336 / 3348
页数:13
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