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- [1] Interface Engineering for High-Performance Top-Gated MoS2 Field-Effect TransistorsADVANCED MATERIALS, 2014, 26 (36) : 6255 - 6261Zou, Xuming论文数: 0 引用数: 0 h-index: 0机构: Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R China Wuhan Univ, Minist Educ, Key Lab Artificial Micro & Nanostruct, Wuhan 430072, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaWang, Jingli论文数: 0 引用数: 0 h-index: 0机构: Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R China Wuhan Univ, Minist Educ, Key Lab Artificial Micro & Nanostruct, Wuhan 430072, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaChiu, Chung-Hua论文数: 0 引用数: 0 h-index: 0机构: Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 30010, Taiwan Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaWu, Yun论文数: 0 引用数: 0 h-index: 0机构: Nanjing Elect Device Inst, Sci & Technol Monolith Integrated Circuits & Modu, Nanjing, Jiangsu, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaXiao, Xiangheng论文数: 0 引用数: 0 h-index: 0机构: Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R China Wuhan Univ, Minist Educ, Key Lab Artificial Micro & Nanostruct, Wuhan 430072, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaJiang, Changzhong论文数: 0 引用数: 0 h-index: 0机构: Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R China Wuhan Univ, Minist Educ, Key Lab Artificial Micro & Nanostruct, Wuhan 430072, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaWu, Wen-Wei论文数: 0 引用数: 0 h-index: 0机构: Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 30010, Taiwan Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaMai, Liqiang论文数: 0 引用数: 0 h-index: 0机构: Wuhan Univ Technol, Sch Mat Sci & Engn, WUT Harvard Joint Nano Key Lab, Wuhan 430070, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaChen, Tangsheng论文数: 0 引用数: 0 h-index: 0机构: Nanjing Elect Device Inst, Sci & Technol Monolith Integrated Circuits & Modu, Nanjing, Jiangsu, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaLi, Jinchai论文数: 0 引用数: 0 h-index: 0机构: Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R China Wuhan Univ, Minist Educ, Key Lab Artificial Micro & Nanostruct, Wuhan 430072, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaHo, Johnny C.论文数: 0 引用数: 0 h-index: 0机构: City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R ChinaLiao, Lei论文数: 0 引用数: 0 h-index: 0机构: Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R China Wuhan Univ, Minist Educ, Key Lab Artificial Micro & Nanostruct, Wuhan 430072, Peoples R China Wuhan Univ, Dept Phys, Minist Educ, Wuhan 430072, Peoples R China
- [2] Electron Irradiation of Metal Contacts in Monolayer MoS2 Field-Effect TransistorsACS APPLIED MATERIALS & INTERFACES, 2020, 12 (36) : 40532 - 40540论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:
- [3] Trapped charge modulation at the MoS2/SiO2 interface by a lateral electric field in MoS2 field-effect transistorsNANO FUTURES, 2019, 3 (01)Pak, Jinsu论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaCho, Kyungjune论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaKim, Jae-Keun论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaJang, Yeonsik论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaShin, Jiwon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaKim, Jaeyoung论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaSeo, Junseok论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaChung, Seungjun论文数: 0 引用数: 0 h-index: 0机构: KIST, Photoelect Hybrids Res Ctr, Seoul 02792, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaLee, Takhee论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea
- [4] Energetic mapping of oxide traps in MoS2 field-effect transistors2D MATERIALS, 2017, 4 (02):Illarionov, Yury Yu论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria Ioffe Phys Tech Inst, Polytech Skaya 26, St Petersburg 194021, Russia TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaKnobloch, Theresia论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaWaltl, Michael论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaRzepa, Gerhard论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaPospischil, Andreas论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Photon, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaPolyushkin, Dmitry K.论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Photon, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaFurchi, Marco M.论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Photon, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaMueller, Thomas论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Photon, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaGrasser, Tibor论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria
- [5] The role of charge trapping in MoS2/SiO2 and MoS2/hBN field-effect transistors2D MATERIALS, 2016, 3 (03):Illarionov, Yury Yu论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria Ioffe Phys Tech Inst, Polytech Skaya 26, St Petersburg 194021, Russia TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaRzepa, Gerhard论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaWaltl, Michael论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaKnobloch, Theresia论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaGrill, Alexander论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaFurchi, Marco M.论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Photon, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaMueller, Thomas论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Photon, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, AustriaGrasser, Tibor论文数: 0 引用数: 0 h-index: 0机构: TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria TU Wien, Inst Microelect, Gusshausstr 27-29, A-1040 Vienna, Austria
- [6] Improving the Stability of High-Performance Multilayer MoS2 Field-Effect TransistorsACS APPLIED MATERIALS & INTERFACES, 2017, 9 (49) : 42943 - 42950Liu, Na论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South KoreaBaek, Jongyeol论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South KoreaKim, Seung Min论文数: 0 引用数: 0 h-index: 0机构: KIST, Inst Adv Composite Mat, Jeonbuk 55324, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South KoreaHong, Seongin论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South KoreaHong, Young Ki论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South KoreaKim, Yang Soo论文数: 0 引用数: 0 h-index: 0机构: Chungnam Natl Univ, Dept Mat Sci & Engn, Taejon 305764, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South KoreaKim, Hyun-Suk论文数: 0 引用数: 0 h-index: 0机构: Chungnam Natl Univ, Dept Mat Sci & Engn, Taejon 305764, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South KoreaKim, Sunkook论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South KoreaPark, Jozeph论文数: 0 引用数: 0 h-index: 0机构: Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea
- [7] Flexible High-Temperature MoS2 Field-Effect Transistors and Logic GatesACS NANO, 2024, 18 (13) : 9627 - 9635Zou, Yixuan论文数: 0 引用数: 0 h-index: 0机构: Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R China Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R ChinaLi, Peng论文数: 0 引用数: 0 h-index: 0机构: Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, Wuhan 430074, Peoples R China Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R ChinaSu, Caizhen论文数: 0 引用数: 0 h-index: 0机构: Beijing Informat Sci & Technol Univ, Beijing 100192, Peoples R China Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R ChinaYan, Jiawen论文数: 0 引用数: 0 h-index: 0机构: Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R China Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R ChinaZhao, Haojie论文数: 0 引用数: 0 h-index: 0机构: Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R China Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R ChinaZhang, Zekun论文数: 0 引用数: 0 h-index: 0机构: Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R China Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R ChinaYou, Zheng论文数: 0 引用数: 0 h-index: 0机构: Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R China Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R China
- [8] Reduced dopant-induced scattering in remote charge-transfer-doped MoS2 field-effect transistorsSCIENCE ADVANCES, 2022, 8 (38)Jang, Juntae论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaKim, Jae-Keun论文数: 0 引用数: 0 h-index: 0机构: Max Planck Inst Microstructure Phys, Weinberg 2, D-06120 Halle, Germany Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaShin, Jiwon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaKim, Jaeyoung论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaBaek, Kyeong-Yoon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaPark, Jaehyoung论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaPark, Seungmin论文数: 0 引用数: 0 h-index: 0机构: Kyung Hee Univ, Dept Phys, Seoul 02447, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaKim, Young Duck论文数: 0 引用数: 0 h-index: 0机构: Kyung Hee Univ, Dept Phys, Seoul 02447, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaParkin, Stuart S. P.论文数: 0 引用数: 0 h-index: 0机构: Max Planck Inst Microstructure Phys, Weinberg 2, D-06120 Halle, Germany Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaKang, Keehoon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Res Inst Adv Mat, Dept Mat Sci & Engn, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaCho, Kyungjune论文数: 0 引用数: 0 h-index: 0机构: Korea Inst Sci & Technol, Soft Hybrid Mat Res Ctr, Seoul 02792, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaLee, Takhee论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea
- [9] Schottky barrier height engineering on MoS2 field-effect transistors using a polymer surface modifier on a contact electrodeDISCOVER NANO, 2023, 18 (01)Choi, Dongwon论文数: 0 引用数: 0 h-index: 0机构: Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South Korea Korea Univ, Dept Elect Engn, Seoul 02841, South Korea Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South KoreaJeon, Jeehoon论文数: 0 引用数: 0 h-index: 0机构: Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South Korea Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South KoreaPark, Tae-Eon论文数: 0 引用数: 0 h-index: 0机构: Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South Korea Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South KoreaJu, Byeong-Kwon论文数: 0 引用数: 0 h-index: 0机构: Korea Univ, Dept Elect Engn, Seoul 02841, South Korea Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South KoreaLee, Ki-Young论文数: 0 引用数: 0 h-index: 0机构: Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South Korea Korea Inst Sci & Technol, Ctr Spintron, Seoul 02792, South Korea
- [10] MoS2 Field-Effect Transistors With Graphene/Metal HeterocontactsIEEE ELECTRON DEVICE LETTERS, 2014, 35 (05) : 599 - 601Du, Yuchen论文数: 0 引用数: 0 h-index: 0机构: Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAYang, Lingming论文数: 0 引用数: 0 h-index: 0机构: Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAZhang, Jingyun论文数: 0 引用数: 0 h-index: 0机构: Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USALiu, Han论文数: 0 引用数: 0 h-index: 0机构: Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAMajumdar, Kausik论文数: 0 引用数: 0 h-index: 0机构: SEMATECH, Albany, NY 12203 USA Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAKirsch, Paul D.论文数: 0 引用数: 0 h-index: 0机构: SEMATECH, Albany, NY 12203 USA Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAYe, Peide D.论文数: 0 引用数: 0 h-index: 0机构: Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA Purdue Univ, Birck Nanotechnol Ctr, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA