Ultrafast carrier dynamics in GeSn thin film based on time-resolved terahertz spectroscopy

被引:1
作者
Huang, Panpan [1 ]
Zhang, Youlu [2 ]
Hu, Kai [1 ]
Qi, Jingbo [2 ,3 ]
Zhang, Dainan [1 ,2 ]
Cheng, Liang [2 ,3 ]
机构
[1] Univ Elect Sci & Technol China, Sch Elect Sci & Engn, Chengdu 611731, Peoples R China
[2] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
[3] Univ Elect Sci & Technol China, Sch Phys, Chengdu 611731, Peoples R China
基金
中国国家自然科学基金; 国家重点研发计划;
关键词
GeSn thin film; time-resolved THz spectroscopy; ultrafast dynamics; carrier recombination; SEMICONDUCTORS;
D O I
10.1088/1674-1056/accf7f
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We measure the time-resolved terahertz spectroscopy of GeSn thin film and studied the ultrafast dynamics of its photo-generated carriers. The experimental results show that there are photo-generated carriers in GeSn under femtosecond laser excitation at 2500 nm, and its pump-induced photoconductivity can be explained by the Drude-Smith model. The carrier recombination process is mainly dominated by defect-assisted Auger processes and defect capture. The first- and second-order recombination rates are obtained by the rate equation fitting, which are (2.6 +/- 1.1) x 10(-2) ps(-1) and (6.6 +/- 1.8) x 10(-19) cm(3)& sdot;ps(-1), respectively. Meanwhile, we also obtain the diffusion length of photo-generated carriers in GeSn, which is about 0.4 mu m, and it changes with the pump delay time. These results are important for the GeSn-based infrared optoelectronic devices, and demonstrate that GeSn materials can be applied to high-speed optoelectronic detectors and other applications.
引用
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页数:6
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