Obtaining the Effective Dielectric Permittivity of a Conducting Surface in the Terahertz Range via the Characteristics of Surface Plasmon Polaritons

Featured Application Surface plasmon refractometry of conducting surfaces applied in terahertz plasmonic integrated circuits and communication lines. With the intensive development of data transmitting and processing devices in the terahertz (THz) frequency range, an important part of which are integrated plasmonic components and communication lines, it becomes necessary to measure correctly the optical constants of their conductive surfaces. In this paper, we describe a reliable method for determining the effective permittivity & epsilon;(m) of a metal surface from the measured characteristics (refractive and absorption indices) of THz surface plasmon polaritons (SPPs). The novelty of the method is the conduction of measurements on a metal surface with a dielectric layer of subwavelength thickness, suppressing the radiative losses of SPPs, which are not taken into account by the SPP dispersion equation. The method is tested on a number of flat "gold sputtering-zinc sulfide layer-air" structures with the use of the THz radiation (& lambda;(0) = 141 & mu;m) from the Novosibirsk free electron laser (NovoFEL). The SPP characteristics are determined from interferograms measured with a plasmon Michelson interferometer. It is found that the method allows a significant increase in the accuracy of the & epsilon;(m) in comparison with measurements on the same metal surface without a dielectric layer.