Heat cycle failure point prediction by 3D thermal stress analysis for medium voltage power module

被引:1
作者
Takahashi, Masaki [1 ]
Jorgensen, Jannick Kjxr [1 ]
Jorgensen, Asger Bjorn [1 ]
Munk-Nielsen, Stig [1 ]
Uhrenfeldt, Christian [1 ]
机构
[1] Aalborg Univ, Dept Energy, Aalborg, Denmark
来源
2023 IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, APEC | 2023年
关键词
10kV SiC-MOSFET power modules; heat cycle; 3D modeling; Finite Element Method; thermo-mechanical stress;
D O I
10.1109/APEC43580.2023.10131157
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The structural optimization of power modules for reliability can be performed without physical prototyping if the structural weakness in modules can be assessed on a 3D model. In this study, 3D thermal stress simulation is investigated as a predictive tool for the heat cycle test (HCT) failure point of the medium voltage power module. The module has a multilayer structure of two different ceramics (A1203 and A1N) to reduce the parasitic capacitance. In this complex structured module, the failure point of actual test samples are shown to coincide with weakness points of the thermo-mechanical stress in the 31) simulation. The heat cycle test (125/-40 degrees C) was used for simulation and testing. The failure point of the module was predominantly copper delamination from the A1N substrate surface after HCT 100 cycles. The delaminated locations were matched to points in the simulation that has 2 characteristics, high peeling stresses points and high shape deformation of copper pattern at the simulation results. This observation applies to copper patterns only connected to the ceramics, while copper patterns connected to other adjacent layers did not follow this trend.
引用
收藏
页码:2668 / 2675
页数:8
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