A Deep Transfer Learning Design Rule Checker With Synthetic Training

被引:1
作者
Francisco, Luis [1 ]
Davis, W. Rhett [1 ]
Franzon, Paul [1 ]
机构
[1] North Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27606 USA
基金
美国国家科学基金会;
关键词
Layout; Design methodology; Convolutional neural networks; Transfer learning; Generators; Deep learning; Manuals; Training data; Design Rule Checking; Machine Learning; IC Verification; Physical Verification; Convolutional Neural Network; Deep Learning; Synthetic Data Training; Transfer Learning;
D O I
10.1109/MDAT.2022.3162786
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Deep transfer learning is applied to the task of design rule checking (DRC). A parameterized synthetic data set generator is used to train the model. -Ulf Schlichtmann, Technical University of Munich
引用
收藏
页码:77 / 84
页数:8
相关论文
共 12 条
  • [1] Bhanushali K., 2015, P 2015 S INT S PHYS, P165, DOI [10.1145/2717764.2717782, DOI 10.1145/2717764.2717782]
  • [2] Design Rule Checking with a CNN Based Feature Extractor
    Francisco, Luis
    Lagare, Tanmay
    Jain, Arpit
    Chaudhary, Somal
    Kulkarni, Madhura
    Sardana, Divya
    Davis, W. Rhett
    Franzon, Paul
    [J]. PROCEEDINGS OF THE 2020 ACM/IEEE 2ND WORKSHOP ON MACHINE LEARNING FOR CAD (MLCAD '20), 2020, : 9 - 14
  • [3] Islam M. R., 2019, 2019 1 INT C ADV SCI, P14, DOI [10.1109/ICASERT.2019.8934760, DOI 10.1109/ICASERT.2019.8934760, 10.1109/icasert.2019.8934760]
  • [4] Islam R, 2019, MIDWEST SYMP CIRCUIT, P1081, DOI [10.1109/MWSCAS.2019.8884896, 10.1109/mwscas.2019.8884896]
  • [5] Accelerating Chip Design With Machine Learning
    Khailany, Brucek
    Ren, Haoxing
    Dai, Steve
    Godil, Saad
    Keller, Ben
    Kirby, Robert
    Klinefelter, Alicia
    Venkatesan, Rangharajan
    Zhang, Yanqing
    Catanzaro, Bryan
    Dally, William J.
    [J]. IEEE MICRO, 2020, 40 (06) : 23 - 32
  • [6] Partial Sharing Neural Networks for Multi-Target Regression on Power and Performance of Embedded Memories
    Last, Felix
    Schlichtmann, Ulf
    [J]. PROCEEDINGS OF THE 2020 ACM/IEEE 2ND WORKSHOP ON MACHINE LEARNING FOR CAD (MLCAD '20), 2020, : 123 - 128
  • [7] Li BW, 2016, IEEE C ELECTR PERFOR, P147, DOI 10.1109/EPEPS.2016.7835438
  • [8] DRC Hotspot Prediction at Sub-10nm Process Nodes Using Customized Convolutional Network
    Liang, Rongjian
    Xiang, Hua
    Pandey, Diwesh
    Reddy, Lakshmi
    Ramji, Shyam
    Nam, Gi-Joon
    Hu, Jiang
    [J]. PROCEEDINGS OF THE 2020 INTERNATIONAL SYMPOSIUM ON PHYSICAL DESIGN (ISPD'20), 2020, : 135 - 142
  • [9] Machine Learning-Based Hotspot Detection: Fallacies, Pitfalls and Marching Orders
    Reddy, Gaurav Rajavendra
    Madkour, Kareem
    Makris, Yiorgos
    [J]. 2019 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2019,
  • [10] Incremental Learning in Deep Convolutional Neural Networks Using Partial Network Sharing
    Sarwar, Syed Shakib
    Ankit, Aayush
    Roy, Kaushik
    [J]. IEEE ACCESS, 2020, 8 (08): : 4615 - 4628