Femtosecond Laser-Induced Nano-Joining of Volatile Tellurium Nanotube Memristor

被引:6
|
作者
Yu, Yongchao [1 ,2 ]
Joshi, Pooran [3 ]
Bridges, Denzel [1 ]
Fieser, David [1 ]
Hu, Anming [1 ]
机构
[1] Univ Tennessee Knoxville, Dept Mech Aerosp & Biomed Engn, 1512 Middle Dr, Knoxville, TN 37996 USA
[2] Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore
[3] Oak Ridge Natl Lab, 1 Bethel Valley Rd, Oak Ridge, TN 37831 USA
关键词
memristor; tellurium nanotube; laser joining; nano-joining; THIN-FILMS; MEMORY; PHASE; HETEROJUNCTIONS; TRANSISTORS; BEHAVIOR; SYSTEM; SWITCH;
D O I
10.3390/nano13050789
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Nanowire/nanotube memristor devices provide great potential for random-access high-density resistance storage. However, fabricating high-quality and stable memristors is still challenging. This paper reports multileveled resistance states of tellurium (Te) nanotube based on the clean-room free femtosecond laser nano-joining method. The temperature for the entire fabrication process was maintained below 190 degrees C. A femtosecond laser joining technique was used to form nanowire memristor units with enhanced properties. Femtosecond (fs) laser-irradiated silver-tellurium nanotube-silver structures resulted in plasmonic-enhanced optical joining with minimal local thermal effects. This produced a junction between the Te nanotube and the silver film substrate with enhanced electrical contacts. Noticeable changes in memristor behavior were observed after fs laser irradiation. Capacitor-coupled multilevel memristor behavior was observed. Compared to previous metal oxide nanowire-based memristors, the reported Te nanotube memristor system displayed a nearly two-order stronger current response. The research displays that the multileveled resistance state is rewritable with a negative bias.
引用
收藏
页数:16
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