Deflectometry for specular surfaces: an overview

被引:24
作者
Burke, Jan [1 ]
Pak, Alexey [1 ,2 ]
Hoefer, Sebastian [1 ]
Ziebarth, Mathias [1 ]
Roschani, Masoud [1 ]
Beyerer, Juergen [1 ,3 ]
机构
[1] Fraunhofer Inst Optron Syst Technol & Image Explo, Karlsruhe, Germany
[2] Fraunhofer Inst Optron Syst Technol & Image Explo, Fraunhofer Ctr Machine Learning, Karlsruhe, Germany
[3] Inst Technol KIT, Dept Informat, Vis & Fus Lab IES, Karlsruhe, Germany
关键词
deflectometry; optical inspection; surface inspection; optical metrology; 07.60.-j optical instruments and equipment; 3D SHAPE MEASUREMENT; WAVE-FRONT RECONSTRUCTION; PHASE-MEASURING DEFLECTOMETRY; FRINGE PROJECTION PROFILOMETRY; CHINESE REMAINDER THEOREM; REFLECTION GRATING METHOD; IN-LINE INSPECTION; CAMERA CALIBRATION; GRAY-CODE; DEFECT DETECTION;
D O I
10.3389/aot.2023.1237687
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Deflectometry as a technique to assess reflective surfaces has now existed for some 40 years. Its different aspects and variations have been studied in multiple theses and research articles; reviews are available for certain subtopics. Still a field of active development with many unsolved problems, deflectometry now encompasses a large variety of application domains, hardware setup types, and processing workflows for different purposes, and spans a range from qualitative defect inspection of large vehicles to precision measurements of microscopic optics. Over these years, many exciting developments have accumulated in the underlying theory, in the systems design, and in the implementation specifics. This diversity of topics is difficult to grasp for experts and non-experts alike and may present an obstacle to a wider acceptance of deflectometry as a useful tool for research and industrial applications. This paper presents an attempt to summarize the status of deflectometry and to map relations between its notable branches. Its aim is to provide a communication basis for experienced practitioners and also to offer a convenient entry point for those interested in learning about the method. The list of references introduces some prominent trends and established research groups in order to facilitate further self-directed exploration.
引用
收藏
页数:46
相关论文
共 592 条
[1]  
Abheiden M., 2014, THESIS C VONOSSIETZK
[2]  
Adato Y., 2010, P BR MACH VIS C 2010, V11, P22, DOI [10.5244/C.24.22, DOI 10.5244/C.24.22]
[3]  
Adato Y, 2007, IEEE I CONF COMP VIS, P433
[4]  
Adato Y, 2011, PROC CVPR IEEE, P1145, DOI 10.1109/CVPR.2011.5995419
[5]   Shape from Specular Flow [J].
Adato, Yair ;
Vasilyev, Yuriy ;
Zickler, Todd ;
Ben-Shahar, Ohad .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2010, 32 (11) :2054-2070
[6]   Rectangular domain curl polynomial set for optical vector data processing and analysis [J].
Aftab, Maham ;
Graves, Logan R. ;
Burge, James H. ;
Smith, Greg A. ;
Oh, Chang-Jin ;
Kim, Dae Wook .
OPTICAL ENGINEERING, 2019, 58 (09)
[7]  
Agrawal A, 2006, LECT NOTES COMPUT SC, V3951, P578
[8]   On the optimality of the binary reflected gray code [J].
Agrell, E ;
Lassing, J ;
Ström, EG ;
Ottosson, T .
IEEE TRANSACTIONS ON INFORMATION THEORY, 2004, 50 (12) :3170-3182
[9]   The wire optical test: a thorough analytical study in and out of caustic surface, and advantages of a dynamical adaptation [J].
Alejandro Juarez-Reyes, Salvador ;
Teresa Sosa-Sanchez, Citlalli ;
Silva-Ortigoza, Gilberto ;
de Jesus Cabrera-Rosas, Omar ;
Espindola-Ramos, Ernesto ;
Ortega-Vidals, Paula .
JOURNAL OF OPTICS, 2018, 20 (03)
[10]   Topography measurement of freeform specular surfaces using experimental ray tracing and radial basis functions [J].
Alinoori, A. ;
Essameldin, M. ;
Fleischmann, F. ;
Henning, T. .
REFLECTION, SCATTERING, AND DIFFRACTION FROM SURFACES V, 2016, 9961