Cross-Coupled Ferroelectric FET-Based Ternary Content Addressable Memory With Energy-Efficient Match Line Scheme

被引:5
作者
Lim, Sehee [1 ]
Ko, Dong Han [1 ]
Kim, Se Keon [1 ]
Jung, Seong-Ook [1 ]
机构
[1] Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South Korea
基金
新加坡国家研究基金会;
关键词
Ferroelectric field-effect transistor (FeFET); match line (ML); nonvolatile; search yield; ternary content addressable memory (TCAM); write disturbance; write failure; RELIABLE SEARCH OPERATION; FIELD-EFFECT TRANSISTOR; NONVOLATILE MEMORY; CELL;
D O I
10.1109/TCSI.2022.3222383
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Fast communication between networking devices increases the importance of the ternary content addressable memory (TCAM). The demands for low energy in networking devices have accelerated the research on nonvolatile TCAMs that store data without the power supply. Recently, ferroelectric field-effect transistors (FeFETs), nonvolatile three-terminal devices with a high on/off ratio, have been adopted for TCAMs. Although the previous FeFET TCAMs consume low write energy with a significantly compact TCAM cell area, they suffer from write problems: 1) the write scheme cannot afford the saturated polarization switching in FeFETs and 2) the states stored in the unselected TCAM cells are changed during the write operation. In addition, search yield is deteriorated by wide process variations of FeFETs. This paper proposes a novel FeFET TCAM that is free from the write problems of the previous FeFET TCAMs and tolerant to process variations. This paper also proposes a novel match line scheme to improve search energy and time by reducing match line capacitance and the amount of discharged voltage in the match evaluation phase. Industrial-compatible 28 nm technology-based simulation results with the Preisach FeFET model show that the proposed FeFET TCAM achieves the highest search yield.
引用
收藏
页码:806 / 818
页数:13
相关论文
共 37 条
[1]   High Endurance Ferroelectric Hafnium Oxide-Based FeFET Memory Without Retention Penalty [J].
Ali, T. ;
Polakowski, P. ;
Riedel, S. ;
Buettner, T. ;
Kaempfe, T. ;
Rudolph, M. ;
Paetzold, B. ;
Seidel, K. ;
Loehr, D. ;
Hoffmann, R. ;
Czernohorsky, M. ;
Kuehnel, K. ;
Steinke, P. ;
Calvo, J. ;
Zimmermann, K. ;
Mueller, J. .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 65 (09) :3769-3774
[2]   Variability Study of Ferroelectric Field-Effect Transistors Towards 7nm Technology Node [J].
Choe, Gihun ;
Yu, Shimeng .
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2021, 9 :1131-1136
[3]   Self-Referenced Single-Ended Resistance Monitoring Write Termination Scheme for STT-RAM Write Energy Reduction [J].
Choi, Sara ;
Ahn, Hong Keun ;
Song, Byungkyu ;
Kang, Seung H. ;
Jung, Seong-Ook .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2021, 68 (06) :2481-2493
[4]   Corner-Aware Dynamic Gate Voltage Scheme to Achieve High Read Yield in STT-RAM [J].
Choi, Sara ;
Na, Taehui ;
Kim, Jisu ;
Kim, Jung Pill ;
Kang, Seung H. ;
Jung, Seong-Ook .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 24 (09) :2851-2860
[5]   Experimental Demonstration of Gate-Level Logic Camouflaging and Run-Time Reconfigurability Using Ferroelectric FET for Hardware Security [J].
Dutta, Sourav ;
Grisafe, Benjamin ;
Frentzel, Chloe ;
Enciso, Zephan ;
San Jose, Matthew ;
Smith, Jeffrey ;
Ni, Kai ;
Joshi, Siddharth ;
Datta, Suman .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (02) :516-522
[6]  
Fedorov VV, 2014, PR IEEE COMP DESIGN, P55, DOI 10.1109/ICCD.2014.6974662
[7]   Back-End, CMOS-Compatible Ferroelectric Field-Effect Transistor for Synaptic Weights [J].
Halter, Mattia ;
Begon-Lours, Laura ;
Bragaglia, Valeria ;
Sousa, Marilyne ;
Offrein, Bert Jan ;
Abel, Stefan ;
Luisier, Mathieu ;
Fompeyrine, Jean .
ACS APPLIED MATERIALS & INTERFACES, 2020, 12 (15) :17737-17744
[8]  
Ishida Koichi, 2009, 2009 IEEE International Solid-State Circuits Conference (ISSCC 2009), P238, DOI 10.1109/ISSCC.2009.4977396
[9]   Bitline Precharging and Preamplifying Switching pMOS for High-Speed Low-Power SRAM [J].
Jeong, Hanwool ;
Park, Juhyun ;
Oh, TaeWoo ;
Rim, Woojin ;
Song, Taejoong ;
Kim, Gyuhong ;
Won, Hyo-Sig ;
Jung, Seong-Ook .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2016, 63 (11) :1059-1063
[10]  
Jiang B, 1997, 1997 SYMPOSIUM ON VLSI TECHNOLOGY, P141, DOI 10.1109/VLSIT.1997.623738