Ag-(In-Bi) Solid-Liquid Interdiffusion Bonding

被引:3
作者
Kuziora, Stephane Leonard [1 ]
Nguyen, Hoang-Vu [1 ]
Aasmundtveit, Knut Eilif [1 ]
机构
[1] Univ South Eastern Norway, Dept MicroSyst, Borre, Norway
关键词
Ag-In-Bi; SLID; TLP; intermetallics; MICROSTRUCTURE; JOINTS; SOLDER; SILVER;
D O I
10.1007/s11664-022-10063-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Solid-liquid interdiffusion is a metallurgical bonding technique, suitable for assembly of temperature sensitive materials. We identify Ag-(In-Bi) as meeting the low-temperature bonding requirements, theoretically as low as 73 degrees C. This work focuses on understanding the bonding process and the interactions between the metal elements. Ag-(In-Bi) was bonded using an eutectic In-Bi foil at both 150 degrees C and 180 degrees C. The resulting bondlines were layered as Ag/Ag9In4/AgIn2/In-Bi compounds/AgIn2/Ag9In4/Ag. At some sections the phase growth of AgIn2 or Ag9In4 bridged the bond. Because of this bridging of gamma-Ag9In4, temperature stability of similar to 480-570 degrees C, is readily possible. The majority of the remaining Bi was located within large pockets near the middle of the bondline, and the minority as precipitates in protruding arms. Mechanisms for these Bi precipitates and intermetallic arm growth are discussed, and the evidence indicates that dissolution and surface planarity play important roles in their formation.
引用
收藏
页码:1284 / 1294
页数:11
相关论文
共 25 条
[1]   In-Bi low-temperature SLID bonding for piezoelectric materials [J].
Aasmundtveit, Knut E. ;
Eggen, Trym ;
Manh, Tung ;
Hoang-Vu Nguyen .
SOLDERING & SURFACE MOUNT TECHNOLOGY, 2018, 30 (02) :100-105
[2]  
[Anonymous], 2021, STRUERS GRINDING POL
[3]  
[Anonymous], 2007, COMS MULT
[4]  
BERNSTEIN L, 1966, T METALL SOC AIME, V236, P405
[5]  
Bolstad PK, 2019, IEEE INT ULTRA SYM, P1765, DOI [10.1109/ultsym.2019.8926207, 10.1109/ULTSYM.2019.8926207]
[6]  
Cosovic V, 2017, METALL MATER ENG, V23, P65
[7]  
Haynes W.M., 2016, CRC Handbook of Chemistry and Physics, V96, DOI DOI 10.1201/9781315380476
[8]   Effect of Bi Segregation on the Asymmetrical Growth of Cu-Sn Intermetallic Compounds in Cu/Sn-58Bi/Cu Sandwich Solder Joints During Isothermal Aging [J].
Hu, Xiaowu ;
Li, Yulong ;
Li, Ke ;
Min, Zhixian .
JOURNAL OF ELECTRONIC MATERIALS, 2013, 42 (12) :3567-3572
[9]  
Kang SJL., 2005, sintering, densification, grain growth, microstructure, P117, DOI DOI 10.1016/B978-075066385-4/50009-1
[10]   Bismuth segregation enhances intermetallic compound growth in SnBi/Cu microelectronic interconnect [J].
Kang, T. Y. ;
Xiu, Y. Y. ;
Liu, C. Z. ;
Hui, L. ;
Wang, J. J. ;
Tong, W. P. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2011, 509 (05) :1785-1789