Fabrication of low dielectric constant fluorinated poly(arylene ether nitrile) composites by cross-linking with metal-organic frameworks

被引:10
|
作者
Peng, Jun [1 ]
Cao, Tong [1 ]
You, Yong [2 ]
Liu, Xiaobo [1 ,3 ]
Huang, Yumin [1 ,3 ,4 ]
机构
[1] Univ Elect Sci & Technol China, Sch Mat & Energy, Chengdu 611731, Peoples R China
[2] Southwest Minzu Univ, Sch Chem & Environm, Key Lab Gen Chem, Natl Ethn Affairs Commiss, Chengdu 610041, Peoples R China
[3] Sichuan Prov Engn Technol Res Ctr Novel CN Polymer, Chengdu 611731, Peoples R China
[4] Guangdong Hongchang Chem Co Ltd, Foshan 528329, Peoples R China
基金
中国国家自然科学基金;
关键词
Fluorinated poly(arylene ether nitrile); MOF-3; Low dielectric constant; Outstanding mechanical properties; Low water uptake; LOW-K; FILMS; STABILITY; MEMBRANE;
D O I
10.1016/j.polymer.2023.126229
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The communication industry has been developing rapidly, but there is still a huge challenge in low dielectric materials. Porous polymer materials have been extensively studied as low dielectric materials. However, their application is limited by poor mechanical properties, high water absorption, etc. In this work, fluorinated poly (arylene ether nitrile) containing carboxyl groups (PEN) are designed and synthesized and then MOF-3 is used as a nanoporous filler and crosslinker. Through simple heat treatment, cross-linked networks are constructed and the overall performance of the composite films has been significantly improved. Benefiting from the introduction of cross-linked networks and the porous structure of MOF-3, the dielectric constant of PEN-M-3 composite films is as low as 2.33 at 1 MHz, and the water uptake is as low as 0.126%. In addition, all the composite films have excellent thermal stability (T5% > 490 degrees C) and outstanding mechanical properties (tensile strength > 82 MPa). Such excellent performance will have the potential to be applied to low dielectric materials, and this strategy will also provide a new approach for the design and preparation of low dielectric materials.
引用
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页数:9
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