Leaf Spot Caused by Alternaria tenuissima on Rhamnella franguloides in China

被引：0
作者：
Pan, Xiangming [1 ]
Zhou, Yixuan [1 ]
Liu, Dongxue [1 ]
Wang, Yiyi [1 ]
Sheng, Yuting [1 ]
Zhang, Hongxia [1 ,2 ]
机构：
[1] Ludong Univ, Engn Res Inst Agr & Forestry, Yantai 264025, Shandong, Peoples R China
[2] Shandong Acad Agr Sci, Shandong Inst Sericulture, Yantai 265503, Shandong, Peoples R China
来源：
PLANT DISEASE | 2024年 / 108卷 / 04期
关键词：
Alternaria tenuissima; pathogen detection; Rhamnella franguloides;
D O I：
10.1094/PDIS-11-23-2342-PDN
中图分类号：
Q94 [植物学];
学科分类号：
071001 ;
摘要：
引用
收藏
页数：1
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