Probabilistic and defect tolerant fatigue assessment of AM materials under size effect

被引:13
作者
Niu, Xiaopeng [1 ]
Zhu, Shun-Peng [1 ,2 ,3 ]
He, Jin-Chao [1 ]
Luo, Changqi [1 ]
Wang, Qingyuan [3 ,4 ]
机构
[1] Univ Elect Sci & Technol China, Sch Mech & Elect Engn, Chengdu 611731, Peoples R China
[2] Inst Elect & Informat Engn UESTC Guangdong, Dongguan 523808, Peoples R China
[3] Sichuan Univ, Coll Architecture & Environm, MOE Key Lab Deep Earth Sci & Engn, Chengdu 610065, Peoples R China
[4] Chengdu Univ, Adv Res Inst, Chengdu 610106, Peoples R China
基金
中国国家自然科学基金;
关键词
Extremum value statistics; Weakest-link theory; Size effect; AM materials; Defect tolerant; GENERALIZED PARETO DISTRIBUTION; QUALITY-CONTROL; STATISTICS; STRENGTH; LIMIT;
D O I
10.1016/j.engfracmech.2022.109000
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
Basic fatigue properties captured by laboratory testing of small specimens are usually applied to safety design of actual components. Nevertheless, their fatigue performances are significantly different due to size effect attributing a fault to possibility of large defects occur. Accordingly, extreme value statistics and weakest-link theory are applicable to defect tolerant fatigue assessment under size effect in this study. Firstly, the basic theory of extreme value statistics and weakest-link are explicated. Then, a probabilistic framework is developed to estimate the fatigue strength/life of Additive manufacturing (AM) material, wherein size effect and fatigue scatter from statistical viewpoint are illustrated and quantitative analysis. In particular, different types of size effect are simplified and unified as defect size variation, and the quantile of the critical defect derived by extreme value statistics is implemented to estimate the bounds of fatigue performance. Finally, three groups of additive manufactured specimens with different volume and processing parameters are utilized for method validation and comparison, which show great capability to estimate the fatigue scatter of AM material under size effect. The goal of this study is also to clarify the potential application of extreme value statistics and weakest-link theory from the probability and defect tolerant perspective.
引用
收藏
页数:15
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