Scalable hot carrier-assisted silicon photodetector array based on ultrathin gold film

被引:1
|
作者
Kim, Geunpil [1 ,2 ]
Kim, Hyebi [1 ,2 ]
Jeon, Young-Uk [1 ,2 ]
Kim, In Soo [1 ,3 ]
Kim, Soo Jin [2 ]
Kim, Sangsik [4 ]
Kim, Jongbum [1 ]
机构
[1] Korea Inst Sci & Technol KIST, Nanophoton Res Ctr, Seoul 02792, South Korea
[2] Korea Univ, Sch Elect Engn, 145 Anam Ro, Seoul 02841, South Korea
[3] Sungkyunkwan Univ SKKU, KIST SKKU Carbon Neutral Res Ctr, Suwon 16419, South Korea
[4] Korea Adv Inst Sci & Technol, Sch Elect Engn, Daejeon 34141, South Korea
关键词
NIR photodetection; hot carrier; extinction coefficient; gold film; photodetector array; SCHOTTKY JUNCTION; HIGH-DETECTIVITY; HETEROJUNCTION; ABSORPTION; GENERATION; AU; CU;
D O I
10.1515/nanoph-2023-0656
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Silicon (Si) offers cost-effective production and convenient on-chip integration for photodetection due to its well-established CMOS technology. However, the indirect bandgap of Si inherently limits its detection efficiency in the near-infrared (NIR) regime. Here, we propose a strategy to achieve high NIR photoresponse in Si by introducing a strong light-absorbing ultrathin gold (Au) film to generate hot carriers. Using a 4.6 nm thick-Au film deposited on Si, we achieved photoresponsivity of 1.6 mA/W at 1310 nm under zero-bias conditions, and rapid temporal responses of 7.5 and 8 mu s for rise and fall times, respectively, comparable to germanium (Ge) photodiodes. By utilizing an ultrathin (<6 nm) Au film as the light-detecting layer and thicker (>100 nm) Au film as electrodes, we introduce a unique approach to design a photodiode array based on a single metal (Au) platform. Comparative analysis with a commercial beam profiler image validates the performance of our designed array. This work presents an efficient strategy for manufacturing cost-effective and scalable NIR photodetector arrays, which eliminates the need for additional insulator layers.
引用
收藏
页码:1049 / 1057
页数:9
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