SLM ISA and Hardware Extensions for RISC-V Processors

被引:2
|
作者
Ghasemi, S. Maryam [1 ]
Meschkov, Sergej [1 ]
Krautter, Jonas [1 ]
Gnad, Dennis R. E. [1 ]
Tahoori, Mehdi B. [1 ]
机构
[1] Karlsruhe Inst Technol KIT, Inst Comp Engn, Karlsruhe, Germany
关键词
Silicon Lifecycle Management; Design-forTestability; FPGA; parametric testing; in-field testing;
D O I
10.1109/IOLTS59296.2023.10224880
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Nowadays, RISC-V processors have attracted much attention due to their extendability, for targeting high performance applications with strict demands on functional safety. Silicon Lifecycle Management (SLM) is a new emerging concept aiming at functional safety among other features such as availability, maintainability, and lifetime extension. This concept helps to monitor the system health during its lifecycle, in the various timespans, to ensure that safety margins while running critical applications are not exceeded. Hence, enabling both the collection of chip parametrics as well as in-field testing will provide the means to fulfill this concept. In this work, we propose instruction set extensions for enabling SLM in a RISC-V based system. For this purpose, we introduce Path Transient Monitors (PTM) and Voltage Fluctuations Monitors (VFM) for monitoring path delay and voltage fluctuations. Using power wasters as a mean to inject voltage fluctuations in the FPGA system, we evaluate the abilities of this system to monitor chip degradation in early stages before system failure.
引用
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页数:5
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