Hole Injection Characteristics and Annealing Temperature Dependence for Organic Light-Emitting Diodes Using Spontaneous Polarization

被引:1
作者
Fukazawa, Ryosuke [1 ]
Maegawa, Yoshiki [2 ]
Morimoto, Masahiro [3 ]
Matsubara, Ryosuke [4 ]
Kubono, Atsushi [4 ]
Naka, Shigeki [3 ]
机构
[1] Univ Toyama, Grad Sch Sci & Engn, 3190 Gofuku, Toyama 9308555, Japan
[2] Univ Toyama, Grad Sch Sci & Engn Educ, 3190 Gofuku, Toyama 9308555, Japan
[3] Univ Toyama, Acad Assembly Fac Engn, 3190 Gofuku, Toyama 9308555, Japan
[4] Shizuoka Univ, Dept Elect & Mat Sci, 3-5-1 Johoku,Naka Ku, Hamamatsu, Shizuoka 4328561, Japan
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2023年 / 220卷 / 24期
关键词
annealing; hole injection layer; organic light-emitting diodes; spontaneous polarization; DEVICES; CRYSTALLINE; TRANSITION; BEHAVIOR; METAL;
D O I
10.1002/pssa.202300161
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An efficient carrier injection at the electrode/organic semiconductor interface of organic light-emitting diodes (OLEDs) is challenging. It is well-known that an electric dipole at the electrode/semiconductor interface improves the carrier injection from the electrode because of a vacuum-level shift. In this study, poly (vinylidene fluoride-trifluoroethylene) [P(VDF/TrFE)] is used as a polar polymer with spontaneous polarization. P(VDF/TrFE) is spin-coated on an indium tin oxide (ITO) electrode surface as a hole injection layer for OLEDs. The P(VDF/TrFE) layer enhances the hole injection from the ITO electrode by causing a vacuum-level shift. As a result, the device driving voltage can be lowered. In addition, annealing temperature dependence is observed. To investigate the origin of the hole injection effect, the P(VDF/TrFE)-layered ITO surface and the thin film structure of the P(VDF/TrFE) layer are measured. The P(VDF/TrFE) layers at different annealing temperatures show no difference in surface properties but show significant differences in the thin film structure. The hole injection of OLEDs is significantly enhanced because of the structural change in ultrathin P(VDF/TrFE) layer.
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页数:6
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